JoVE Logo

Zaloguj się

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic

11.3K Views

06:46 min

August 25th, 2016

DOI :

10.3791/54408-v

August 25th, 2016


Przeglądaj więcej filmów

X ray Imaging

Rozdziały w tym wideo

0:05

Title

0:53

Mounting the High Resolution X-ray Crystal Imaging Spectrometer with Spatial Resolution (HIREXSR) Hardware

4:12

Results: Inverted Plasma Temperature and Torodial Velocity Profiles from Argon Helium-like Spectra

5:38

Conclusion

Powiązane Filmy

article

11:20

Investigation of Early Plasma Evolution Induced by Ultrashort Laser Pulses

14.9K Views

article

08:53

Angle-resolved Photoemission Spectroscopy At Ultra-low Temperatures

17.5K Views

article

07:26

Synthesis and Microdiffraction at Extreme Pressures and Temperatures

11.1K Views

article

08:42

How to Ignite an Atmospheric Pressure Microwave Plasma Torch without Any Additional Igniters

19.4K Views

article

09:41

Emission Spectroscopic Boundary Layer Investigation during Ablative Material Testing in Plasmatron

12.3K Views

article

09:01

High-resolution Thermal Micro-imaging Using Europium Chelate Luminescent Coatings

7.7K Views

article

11:32

High Pressure Single Crystal Diffraction at PX^2

21.4K Views

article

07:17

Non-equilibrium Microwave Plasma for Efficient High Temperature Chemistry

12.5K Views

article

08:36

An Atmospheric Pressure Plasma Setup to Investigate the Reactive Species Formation

9.8K Views

article

11:17

Spark Plasma Sintering Apparatus Used for the Formation of Strontium Titanate Bicrystals

9.8K Views

JoVE Logo

Prywatność

Warunki Korzystania

Zasady

Badania

Edukacja

O JoVE

Copyright © 2025 MyJoVE Corporation. Wszelkie prawa zastrzeżone