Os autores reconhecem apoio financeiro das rosas e dos programas APRA Aeronautics and Space Administration (NASA) &#39;s. GC também reconhece a Universidades Espaço Research Association para administrar sua nomeação na NASA.

1. Microstrip Linha ressonador Fabrication 14 (Figura 3) <ol><li> Limpar uma bolacha de silício sobre isolante (SOI), que tem uma camada do dispositivo de silício de 0,45 um de espessura, com H acabado de misturar 2 SO 4: H 2 O 2 (3: 1) durante 10 min. Em seguida, lavar o wafer em água deionizada por 10 minutos e seque com uma arma de azoto. Imediatamente antes do processamento, posteriormente, mergulhar a bolacha em H 2 O: HF (10: 1) durante 10 seg e de enxaguar em água desionizada, durante 5 min. </li><li> Fabricar uma máscara de lift-off, que consiste de um germânio (Ge) / fotorresistente positivo tal como S-1811. 15 <ol><li> Spin-coat o wafer com diluído bicamada fotorresiste positivo (2 partes mais finas-P: 1 parte fotorresiste positivo) a 4.000 rpm por 30 segundos e, em seguida, depósito por feixe de elétrons Ge. </li><li> Padrão Ge usando a foto-litografia aplicando primeiro hexametildissilazano (HMDS) na bolacha durante 1 min e, em seguida, fiar o excesso a 3000 rpm durante 30 segundos. </li><li> Spin on diluído fotorresiste positivo (2 partes mais finas-P: 1 parte fotorresiste positivo) a 2.000 rpm durante 30 segundos e cozê-lo em uma placa quente para 1 min a 110 ° C. Use um alinhador de máscara para expor fotorresiste e spray desenvolvem resistir com uma solução à base de hidróxido de tetrametilamónio. </li><li> Reativa-ion gravar o Ge com um SF 6 / O 2 plasma a 70 W. Ash subjacente fotorresiste com O2 plasma para alcançar rebaixo de fotorresiste. </li><li> DC-magnetron plano borrifamento de depósito de nióbio (Nb) térreo, com 3,7 milhões de toneladas de argônio (Ar) em 500 W e retire-a, colocando a bolacha dentro de um copo cheio de acetona, durante 4 h. </li></ol></li><li> bisbenzocyclobutene spin-revestimento (BCB) a 4000 rpm durante 30 seg sobre a superfície de Nb-revestido da bolacha SOI e a uma superfície de outra pastilha de silício. Ligar as duas superfícies revestidas com BCB juntamente com 3 bar de pressão a 200 ° C. </li><li> Manualmente aleta pilha wafer de cabeça para baixo para começar a processar parte de trás do wafer SOI. </li><li>Etch a bolacha de silício por punho de polimento mecânico usando o Al 2 O 3 de pasta, seguido por gravação iónica reactiva profunda usando o processo Bosch 16 Etch do enterrado camada SiO 2 com H 2 O:. HF (10: 1) durante 20 min. </li><li> Depósito de molibdénio nitreto (Mo 2 N), utilizando DC pulverização catódica reactiva em 700 W e 3,3 mT (Ar: N2 pressão parcial = 7: 1). ressonadores teste padrão por centrifugação a 2000 rpm durante 30 seg e cozedura a 180 ° C durante 2 min, seguido por fiação diluído fotorresistente positivo (2 partes mais finas-P: 1 parte fotorresistente positiva) a 2.000 rpm durante 30 segundos. Desenvolver fotorresistente em uma solução à base de hidróxido de tetrametil amónio e de cinzas num etcher iões reactivos. Etch Mo 2 N, com uma solução à base de ácido fosfórico. </li><li> Fabricar uma máscara de lift-off consistindo de uma bicamada de Ge / PMMA, girando sobre o polimetilmetacrilato (PMMA) a 5000 rpm durante 30 seg e cozedura a 180 ° C durante 2 min, seguido por dep por feixe de elétronsOSIÇÃO de Ge. Por borrifamento de depósito N ° de linhas de transmissão e levante em acetona (consulte a etapa 1.2, com a excepção de que o fotorresistente positivo é substituído com PMMA). </li><li> Em algumas formas de realização, de rádio-frequência (RF) por pulverização catódica-depósito de SiO2, padrão que por fiação com fotorresiste positivo e gravar em uma solução baseada fluorídrico-ácido. Em seguida, tire uma fina película Nb depositados por borrifamento usando a / máscara fotorresistivo decolagem germânio positiva conforme detalhado na etapa 1.2. </li></ol> 2. Procedimento para Instalação de Microondas ressonador Chip no pacote de teste <ol><li> Concepção e máquina de um conjunto de ensaios que consiste em ouro (Au) cavidade cobre -Revestido (com uma base e tampa) que coincide com dimensões de chips ressonador, entrada de linha de alimentação e locais de saída. NOTA: O tamanho da cavidade da carcaça deve ser especificado para apoiar uma operação de modo único com acoplamento parasita mínima sobre a banda de interesse. </li><li> Projetar e fabricar uma impedância de microondas fã-ou controladat bordo 17 para encaminhar os sinais entre o chip e conectores versão Sub-Miniature A (SMA). </li><li> Inserir os conectores SMA para a entrada e saída do pacote de teste para que o pino condutor central está alinhada sobre a almofada de contacto bordo fan-out correspondente. Aplicar uma máscara para soldar para proteger contra o curto-circuito, e aplicar a solda na região do pino condutor central. Colocar o pacote numa placa de aquecimento e aquecer a 200 ° C durante ~ 5 min para derreter a solda. Deixe esfriar e, em seguida, remover a máscara de solda. </li><li> Montar o chip ressonador na cavidade pacote cobre Au revestido de tal forma que as pastilhas de saída e entrada feedline on-chip estão próximos e alinhado com o correspondente guia de onda coplanar bordo fan-out linhas (CPW). Fixar o chip com os grampos de cobre que fazem contacto com os bordos dos cantos do chip. </li><li> Coloque supercondutores laços de fio de Al entre a placa de fan-out e on-chip de contato. Coloque um número máximo (~ 4 no caso aqui apresentado - veja <strong&gt; Figura 4) de ~ 500-600 mícrons de comprimento, ~ laços de arame 250 mícrons-em-altura, para fornecer jogo de impedância entre a entrada do conector SMA e saídas eo feedline CPW on-chip. </li><li> Depois de fio-ligação, com um multímetro verificar a resistência DC entre os pinos centrais dos conectores de entrada e saída, e entre um pino central e do solo, para confirmar que há uma conexão elétrica entre os dois pinos centrais e de uma conexão aberta entre o centro line e solo. </li></ol> 3. Procedimento para a instalação de micro-ondas ressonador em um criogênico Hélio-3 Testbed Microondas <ol><li> Montar o banco de ensaio, como na configuração mostrada na Figura 2, em que uma série de cabos de SMA são encaminhadas de RT para a fase fria 0,3-K em que o dispositivo vai ser montado. </li><li> Instalação de cobre (Cu) e cabos de supercondutores de nióbio e titânio (NbTi) como mostrado na Figura 2 para proporcionar baixa perda de microondas e, nocaso dos cabos NBTI, uma condutividade térmica baixa. Use os cabos NBTI como uma ruptura térmica entre o 0,3-K fases 2-K e. </li><li> Montar um amplificador criogênico de elétrons de alta mobilidade transistor (HEMT) na fase 2-K na linha de saída para a amplificação de baixo ruído na banda do dispositivo ressonador e instalar um circulador. </li><li> Insira um circulador criogénico na linha de saída na entrada para este amplificador. </li><li> Montar os dispositivos ressonador embalados em um suporte aparafusado à fase fria 0,3-K. </li><li> Conectar um atenuador de microondas no lado de entrada do pacote de prever o termo combinados e ligar os cabos SMA adequadas para esta entrada e de saída do atenuador pacote. Garantir que essas terminações de impedância controlados são bem entrosados ​​e são o mais próximo do dispositivo em teste quanto possível - eles definem o &quot;plano de calibração do dispositivo&quot; (ver Figura 2). </li><li> Feche o criostato. Siga o procedimento padrão para resfriar o dispositivos a 0,3 K. </li></ol> 4. Procedimento para Medidas Microondas ressonador <ol><li> Defina o VNA para digitalizar em uma banda de frequências de largura (10 MHz - 8 GHz, para o dispositivo aqui considerados) às frequências de design do dispositivo em teste. Ajustar os níveis de energia no VNA em níveis adequados para o dispositivo em teste (~ -30 dBm, para o dispositivo considerado aqui). NOTA: Certifique-se de que o nível de potência de RF de entrada é suficientemente baixo de modo a não exceder a corrente crítica do ressonador supercondutor microondas e feedline supercondutor. Certifique-se de que o nível de potência é alta o suficiente para fornecer uma relação adequada entre o sinal e o ruído. </li><li> Calibrar os cabos de RF flexíveis seguindo procedimento padrão Short-Open-Load-Thru (SOLT), seguindo as instruções de software VNA encontrados no manual VNA. Inserção em curto-circuito, aberta, e terminada através de padrões na saída de cada um dos cabos flexíveis, que rota a partir do analisador de rede vector e que mais tarde irá ser ligada à entrada dedo criostato para as medições. Esta calibração define o &quot;plano de referência instrumento&quot; (por exemplo, ver Figura 2). </li><li> Seguindo essa calibração SOLT, verificar a fidelidade da calibração, confirmando que a transmissão, S 21, com o através da linha conectada medido com o VNA, tem erros residuais baixos (ou seja, a resposta é no ~ nível 0 dB e S 11 e S 22 são baixos, por exemplo, ≤ -50 dB). </li><li> Conecte os cabos flexíveis para as linhas de entrada e saída do criostato. </li><li> Ligue o amplificador de microondas criogênico, aplicando a tensão de polarização DC exigido como especificado na documentação fornecida pela empresa para o amplificador de microondas. </li><li> Em primeiro lugar, completar uma varredura de banda larga de VNA (10 MHz - 8 GHz, para o dispositivo considerado aqui) para observar a estrutura de base S 21 e olhar para qualquer Q alta acentuada &lt;/ Em&gt; estruturas indicativas de ressonadores de microondas. </li><li> Em seguida, limitar a gama de frequências (de ~ 2-4 GHz, para o dispositivo considerado aqui) e ajustar o número de pontos de dados (~ 30.000 para o dispositivo considerado aqui) do VNA para fazer a varredura através da banda ressoador. Use uma faixa de frequência ampla o suficiente para fornecer uma extensão de linha de base adequada para ajustes posteriores a esta linha de base para realizar uma calibração in-situ (ver discussão na Introdução). NOTA: Dependendo do nível de ruído, aumentar o número de médias, ou reduzir a largura de banda IF para melhorar a relação sinal-ruído. </li><li> Guarde estas verificações de dados VNA dos dados complexos de transmissão de arquivo para a pós-medição de calibragem in-situ, e análise e extracção de factores de qualidade e frequências de ressonância. 11 </li></ol>

<ol>
	<li>Monfardini, A., et al. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=The+N&#233;el+IRAM+KID+Arrays+(NIKA).">The N&#233;el IRAM KID Arrays (NIKA).</a> J. Low Temp. Phys. 167 (5-6), 834-839 (2012).</li><li>Schlaerth, J. A., et al. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=The+Status+of+Music:+A+Multicolor+Sub/millimeter+MKID+Instrument.">The Status of Music: A Multicolor Sub/millimeter MKID Instrument.</a> J. Low Temp. Phys. 167 (3-4), 347-353 (2012).</li><li>Swenson, L. J., et al. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=MAKO:+a+pathfinder+instrument+for+on-sky+demonstration+of+low-cost+350+micron+imaging+arrays.">MAKO: a pathfinder instrument for on-sky demonstration of low-cost 350 micron imaging arrays.</a> Proc. SPIE. 8452, 84520P (2012).</li><li>Mazin, B. A., Bumble, B., Meeker, S. R., O'Brien, K., McHugh, S., Langman, E. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=A+superconducting+focal+plane+array+for+ultraviolet,+optical,+and+near-infrared+astrophysics.">A superconducting focal plane array for ultraviolet, optical, and near-infrared astrophysics.</a> Opt. Express. 20 (2), 1503-1511 (2012).</li><li>Mazin, B. A. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=.">.</a> Microwave Kinetic Inductance Detectors. , (2005).</li><li>McHugh, S., et al. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=A+readout+for+large+arrays+of+Microwave+Kinetic+Inductance+Detectors.">A readout for large arrays of Microwave Kinetic Inductance Detectors.</a> Rev. Sci. Instrum. 83 (4), 044702 (2012).</li><li>Mazin, B. A., et al. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=ARCONS:+A+2024+Pixel+Optical+through+Near-IR+Cryogenic+Imaging+Spectrophotometer.">ARCONS: A 2024 Pixel Optical through Near-IR Cryogenic Imaging Spectrophotometer.</a> Publ. Astron. Soc. Pac. 123 (933), 1348-1361 (2013).</li><li>Zmuidzinas, J. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Superconducting+Microresonators:+Physics+and+Applications.">Superconducting Microresonators: Physics and Applications.</a> Annu. Rev. Condens. Matter Phys. 3, 169-214 (2012).</li><li>Vijay, R., Slichter, D. H., Siddiqi, I. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Observation+of+Quantum+Jumps+in+a+Superconducting.">Observation of Quantum Jumps in a Superconducting.</a> Artificial Atom. Phys. Rev. Lett. 106 (11), 110502 (2011).</li><li>Krupka, J., Derzakowski, K., Tobar, M., Hartnett, J., Geyer, R. G. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Complex+permittivity+of+some+ultralow+loss+dielectric+crystals+at+cryogenic+temperatures.">Complex permittivity of some ultralow loss dielectric crystals at cryogenic temperatures.</a> Meas. Sci. Technology. 10 (5), 387-392 (1999).</li><li>Cataldo, G., Wollack, E. J., Barrentine, E. M., Brown, A. D., Moseley, S. H., U-Yen, K. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Analysis+and+calibration+techniques+for+superconducting+resonators.">Analysis and calibration techniques for superconducting resonators.</a> Rev. Sci. Instrum. 86 (1), 013103 (2015).</li><li>Russell, D., Cleary, K., Reeves, R. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Cryogenic+probe+station+for+on-wafer+characterization+of+electrical+devices.">Cryogenic probe station for on-wafer characterization of electrical devices.</a> Rev. Sci. Instrum. 83 (4), 044703 (2012).</li><li>Ranzani, L., Spietz, L., Popovic, Z., Aumentado, J. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Two-port+microwave+calibration+at+millikelvin+temperatures.">Two-port microwave calibration at millikelvin temperatures.</a> Rev. Sci. Instrum. 84 (3), 034704 (2013).</li><li>Patel, A., et al. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Fabrication+of+MKIDS+for+the+MicroSpec+Spectrometer.">Fabrication of MKIDS for the MicroSpec Spectrometer.</a> IEEE Trans. Appl. Supercond. 23 (3), 2400404 (2013).</li><li>Brown, A., Patel, A. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=High-Precision+Thin+Film+Metal+Liftoff+Technique.">High-Precision Thin Film Metal Liftoff Technique.</a> , (2015).</li><li>Laermer, F., Schlip, A. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Method+of+anisotropically+etching+silicon.">Method of anisotropically etching silicon.</a> , (1996).</li><li>Chen, D., Wang, Q., Shen, Z. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=A+broadband+microstrip-to-CPW+transition.">A broadband microstrip-to-CPW transition.</a> APMC 2005. Asian-Pac. Conf. Proc. 2 (4), (2005).</li><li>Fano, U. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Sullo+spettro+di+assorbimento+dei+gas+nobili+presso+il+limite+dello+spettro+d'arco.">Sullo spettro di assorbimento dei gas nobili presso il limite dello spettro d'arco.</a> Il Nuovo Cimento. 12 (3), 154-161 (1935).</li><li>Fano, U. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Effects+of+Configuration+Interaction+on+Intensities+and+Phase+Shifts.">Effects of Configuration Interaction on Intensities and Phase Shifts.</a> Phys. Rev. 124 (6), 1866-1878 (1961).</li><li>Marquezini, M. V., Kner, P., Bar-Ad, S., Tignon, J., Chemla, D. S. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Density+dependence+of+the+spectral+dielectric+function+across+a+Fano+resonance.">Density dependence of the spectral dielectric function across a Fano resonance.</a> Phys. Rev. B. 57 (7), 3745-3748 (1998).</li><li>Singh, R., Al-Naib, I., Cao, W., Rockstuhl, C., Koch, M., Zhang, W. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=The+Fano+Resonance+in+Symmetry+Broken+Terahertz+Metamaterials.">The Fano Resonance in Symmetry Broken Terahertz Metamaterials.</a> IEEE Trans. Terahertz Sci. Technol. 3 (6), 820-826 (2013).</li><li>Giannini, V., Francescano, Y., Amrania, H., Phillips, C. C., Maier, S. A. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Fano+Resonances+in+Nanoscale+Plasmonic+Systems:+A+Parameter-Free+Modeling+Approach.">Fano Resonances in Nanoscale Plasmonic Systems: A Parameter-Free Modeling Approach.</a> Nano Lett. 11 (7), 2835-2840 (2011).</li><li>O'Connell, A. D., et al. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Microwave+Dielectric+Loss+at+Single+Photon+Energies+and+Millikelvin+Temperatures.">Microwave Dielectric Loss at Single Photon Energies and Millikelvin Temperatures.</a> Appl. Phys. Lett. 92 (11), 112903 (2008).</li><li>Weber, S. J., Murch, K. W., Slichter, D. H., Vijay, R., Siddiqi, I. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Single+Crystal+Silicon+Capacitor+with+Low+Microwave+Loss+in+the+Single+Photon+Regime.">Single Crystal Silicon Capacitor with Low Microwave Loss in the Single Photon Regime.</a> Appl. Phys. Lett. 98 (17), 172510 (2011).</li><li>Cataldo, G., Hsieh, W. T., Huang, W. C., Moseley, S. H., Stevenson, T. R., Wollack, E. J. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Micro-Spec:+an+ultracompact,+high-sensitivity+spectrometer+for+far-infrared+and+submillimeter+astronomy.">Micro-Spec: an ultracompact, high-sensitivity spectrometer for far-infrared and submillimeter astronomy.</a> Appl. Opt. 53 (6), 1094-1102 (2014).</li></ol>

Os autores declaram que não têm interesses financeiros concorrentes.

O processo de fabricação-flip única fornece um meio para a realização de ressonadores supercondutores em ambos os lados de uma 0,45 mm substrato fina Si monocristalino. Uma pode ser motivado a usar um único cristal de Si dieléctrico porque tem mais do que uma ordem de grandeza menor do que a perda de dieléctricos depositados (tais como Si 3 N 4) com tangentes perda na gama de 4,0-6,5 GHz &lt;1 x 10 - 5. 23-24 a capacidade de padrão apresenta em ambos os lados deste su...

Os avanços na instrumentação astrophysical introduziram recentemente ressonadores de microondas supercondutores para a detecção de luz infravermelha 1 -. 4 Um supercondutor ressonador irá responder à radiação infravermelha de energia E = hv&gt; 2Δ (em que h é a constante de Planck, v é a frequência de radiação e Δ é a energia gap supercondutor). Quando o ressonador é arrefecida para uma temperatura bem abaixo da temperatura crítica supercondutor, esta radiação incidente quebra pares de Cooper no volume ressonador e gera excitações quasiparticle. O aumento na densidade das excitações quasiparticle muda a indutância cinética e, portanto, a impedância complexa superfície do supercondutor. Esta resposta óptica é observada como uma mudança na frequência de ressonância para frequência mais baixa e uma redução no factor de qualidade do ressonador. No canônica esquema de leitura para um vacas microondasdetector de indutância tic (MKID), o ressonador é acoplado a uma linha de alimentação de microondas e um monitoriza a transmissão complexo através desta linha de alimentação de um único tom de frequência de microondas em ressonância. Aqui, a resposta óptica é observada como uma mudança, tanto na amplitude e fase de transmissão de velocidades 5 (Figura 1). Esquemas de multiplexação no domínio da frequência são capazes de ler as matrizes de milhares de ressonadores 6-7. Para conceber e implementar a instrumentação baseada em supercondutor-ressonador com sucesso, as propriedades destas estruturas ressonantes precisam ser caracterizados com precisão e eficiência. Por exemplo, medições de precisão das propriedades de ruído, factores de qualidade Q, as frequências de ressonância (incluindo a sua dependência da temperatura) e propriedades de resposta ópticos ressonadores de supercondutores são desejados no contexto da MKID física do dispositivo, 8 computação de quantum, 9 e a determinação de baixa temateriais mperatura propriedades. 10 Em todos estes casos, é desejável a medição de parâmetros de difusão complexos de transmissão do circuito. Este trabalho concentra-se na determinação do coeficiente de transmissão do complexo do ressonador, S 21, cuja amplitude e de fase pode ser medido com um analisador de rede vector (VNA). Idealmente, o plano de referência VNA (ou porta de teste) seria ligado directamente ao dispositivo sob teste (DUT), mas uma configuração criogénico requer normalmente a utilização de estruturas de linha de transmissão adicional para realizar um corte térmico entre RT (~ 300 K) e a fase fria (~ 0,3 K neste trabalho, ver Fig ure 2). microondas componentes adicionais, tais como acopladores direcionais, circuladores, isoladores, amplificadores, atenuadores, e cabos de interconexão associados podem ser necessários para preparar adequadamente, excite, lidos e bias o dispositivo de interesse. oAs velocidades de fase e as dimensões destes componentes variam quando o arrefecimento da sala a temperaturas criogénicas, e, portanto, afectar a resposta observada no plano de calibração do dispositivo. Estes componentes intermediários entre o instrumento ea influência dispositivo plano de calibração do ganho complexo e precisa ser devidamente contabilizados na interpretação da resposta medida 11. Em teoria, um esquema é necessário que define o plano de referência de medição, idêntico ao utilizado durante a calibração, no DUT. Para alcançar este objectivo, pode-se medir os padrões de calibração ao longo de vários cool-baixos; No entanto, isto coloca restrições sobre a estabilidade do VNA e a repetibilidade do instrumento criogénico, que são difíceis de atingir. Para atenuar estas preocupações, pode-se colocar os padrões necessários no ambiente de teste arrefecidos e alternar entre elas. Este é, por exemplo, similar ao que é encontrado nas estações de sonda de microondas, Onde os padrões de amostra e de calibragem são arrefecidos a 4 K por um fluxo de hélio líquido contínua ou um sistema de ciclo fechado de refrigeração. 12 Este método foi demonstrada em temperaturas sub-kelvin, mas requer um baixo consumo de energia, interruptor de microondas de alta performance na teste de banda de interesse. 13 Um procedimento de calibração in situ, por conseguinte, é desejado que responde pela transmissão de resposta instrumental entre o plano de referência VNA e o plano de calibração do dispositivo (Fig ure 2) e que ultrapasse as limitações dos métodos acima descritos. Este método de calibração criogénico, apresentados e discutidos em detalhe em Cataldo et al. 11, permite que um para caracterizar vários ressoadores sobre uma vasta gama de frequências em comparação com a largura da linha do ressonador e o espaçamento inter-ressonador com uma precisão de aproximadamente 1%. Este artigo incidirá sobre os detalhes da fabricação de amostra e prepprocessos prepara-, teste de set-up e medição procedimentos experimentais utilizados para caracterizar ressonadores supercondutores de microondas com geometrias linha planar. 11

<table><tbody><tr><td colspan="4">&lt;strong&gt;Protocol Section 1&lt;/strong&gt;</td></tr><tr><td>Microposit S-1811 Photoresist</td><td>Shipley</td><td></td><td></td></tr><tr><td>BCB</td><td>Dow</td><td></td><td>3022-35</td></tr><tr><td>SOI wafers</td><td>SOITec</td><td></td><td>Fabricated with SmartCut&lt;sup&gt;TM&lt;/sup&gt; process</td></tr><tr><td>Mo</td><td>Kamis</td><td></td><td>99.99%</td></tr><tr><td>Nb</td><td>Kamis</td><td></td><td>99.95% (excludes Ta)</td></tr><tr><td>E-6 metal etch w/AES</td><td>Fujifilm</td><td></td><td>CPG Grade</td></tr><tr><td>Acetone</td><td>JT Baker</td><td>9005-05</td><td>CMOS Grade</td></tr><tr><td>HF dip (1:10)</td><td>JT Baker</td><td>5397-03</td><td></td></tr><tr><td>PMMA</td><td>Microchem</td><td></td><td>950 PMMA A2</td></tr><tr><td colspan="4">&lt;strong&gt;Protocol Section 2&lt;/strong&gt;</td></tr><tr><td>GE 7031</td><td>General Electric</td><td></td><td>Low-temperature adhesive</td></tr><tr><td colspan="4">&lt;strong&gt;Protocol Sections 3-4&lt;/strong&gt;</td></tr><tr><td>Cryogenic Microwave Amplifier</td><td>MITEQ</td><td>AF S3-02000400-08-CR-4</td><td>2-4 GHz, gain ~30&amp;nbsp;dB</td></tr><tr><td>NbTi Semi-rigid SMA cables</td><td>Coax. Co.</td><td>SC-086/50-NbTi-NbTi</td><td></td></tr><tr><td>Circulator</td><td>PamTech</td><td>CTD1229K</td><td>return loss &gt; -20 dB from 2-4 GHz</td></tr><tr><td>RF attenuator</td><td>Weinschel</td><td>Model-4M</td><td>7 dB attenuation</td></tr><tr><td>Flexible SMA cables</td><td>Teledyne-Storm</td><td>R94-240</td><td>ACCU-TEST</td></tr><tr><td>Vector Network Analyzer</td><td>Agilent</td><td>N5242A PNA-X</td><td></td></tr><tr><td>Liquid He-4 cryogen</td><td>Praxair</td><td></td><td></td></tr><tr><td>Liquid N&lt;sub&gt;2&lt;/sub&gt; cryogen</td><td>Praxair</td><td></td><td></td></tr></tbody></table>

fabrication and characterization of superconducting resonators

Supercondutores ressonadores de microondas são de interesse para uma larga gama de aplicações, incluindo para a sua utilização como detectores de microondas cinética de indução (MKIDs) para a detecção de assinaturas astrofísicas leves, bem como para aplicações de computação quântica e caracterização de materiais. Neste trabalho, os procedimentos são apresentados para a fabricação e caracterização de thin-film ressonadores supercondutores de microondas. A metodologia de fabricação permite a realização de supercondutores ressonadores de linha de transmissão com características de ambos os lados de um dielétrico único cristal de silício atomicamente lisa. Este trabalho descreve o procedimento para a instalação de dispositivos de ressonador em um testbed microondas criogênico e de arrefecimento abaixo da temperatura de transição supercondutora. O set-up do testbed microondas criogênico permite fazer medidas cuidadosas da transmissão de microondas complexo destes dispositivos ressonador, permitindo a extração do properties das linhas supercondutoras e substrato dielétrico (por exemplo, fatores internos de qualidade, perda e frações de indutância cinética), que são importantes para o projeto de dispositivos e desempenho.

A resposta de uma meia-onda Mo ressonador N 2 (Figura 5) fabricado em um dielétrico de silício de cristal único de 0,45 uM foi validado com esta metodologia. Neste exemplo, o acoplamento a uma guia de onda Nb complanar (CPW) linha de alimentação para leitura para fora é conseguido através de acoplamento capacitivo através de uma SiO2 dieléctrico depositado por borrifamento, no &quot;H&quot; região em forma de uma das extremidades abertas d...

Watch this Scientific Journal Video about Fabrication and Characterization of Superconducting Resonators at JoVE.com

Fabrication and Characterization of Superconducting Resonators

Supercondutores ressonadores de microondas são de interesse para a detecção de, aplicações de computação quântica leves e caracterização de materiais. Este trabalho apresenta um procedimento detalhado para a fabricação e caracterização de parâmetros ressonador supercondutor de espalhamento de microondas.

Fabricação e caracterização de supercondutores Resonators

Superconducting microwave resonators are of interest for a wide range of applications, including for their use as microwave kinetic inductance detectors ...

fabrication-and-characterization-of-superconducting-resonators

Universidad de Cartagena UDEC

Research

Education

JoVE Journal

JoVE Core

Electrical Engineering

Physics

Engineering

Unit 1

Transmission Line Parameters

Inductance

SCIENTISTS IN ACTION

10.4K visualizações.  NASA Goddard Space Flight Center.  Supercondutores ressonadores de microondas são de interesse para a detecção de, aplicações de computação quântica leves e caracterização de materiais. Este trabalho apresenta um procedimento detalhado para a fabricação e caracterização de parâmetros ressonador supercondutor de espalhamento de microondas. 

Vídeo: Fabrication and Characterization of Superconducting Resonators

Fabrication of Silica Ultra High Quality Factor Microresonators

Whispering gallery resonant cavities confine light in circular orbits at their periphery.1-2 The photon storage lifetime in the cavity, quantified by the quality factor (Q) of the cavity, can be in excess of 500ns for cavities with Q factors above 100 million. As a result of their low material losses, silica microcavities have demonstrated some of the longest photon lifetimes to date1-2. Since a portion of the circulating light extends outside the resonator, these devices can also be used to probe the surroundings. This interaction has enabled numerous experiments in biology, such as single molecule biodetection and antibody-antigen kinetics, as well as discoveries in other fields, such as development of ultra-low-threshold microlasers, characterization of thin films, and cavity quantum electrodynamics studies.3-7
The two primary silica resonant cavity geometries are the microsphere and the microtoroid. Both devices rely on a carbon dioxide laser reflow step to achieve their ultra-high-Q factors (Q&gt;100 million).1-2,8-9 However, there are several notable differences between the two structures. Silica microspheres are free-standing, supported by a single optical fiber, whereas silica microtoroids can be fabricated on a silicon wafer in large arrays using a combination of lithography and etching steps. These differences influence which device is optimal for a given experiment.
Here, we present detailed fabrication protocols for both types of resonant cavities. While the fabrication of microsphere resonant cavities is fairly straightforward, the fabrication of microtoroid resonant cavities requires additional specialized equipment and facilities (cleanroom). Therefore, this additional requirement may also influence which device is selected for a given experiment.
Introduction
An optical resonator efficiently confines light at specific wavelengths, known as the resonant wavelengths of the device. 1-2 The common figure of merit for these optical resonators is the quality factor or Q. This term describes the photon lifetime (&tau;o) within the resonator, which is directly related to the resonator's optical losses. Therefore, an optical resonator with a high Q factor has low optical losses, long photon lifetimes, and very low photon decay rates (1/&tau;o). As a result of the long photon lifetimes, it is possible to build-up extremely large circulating optical field intensities in these devices. This very unique property has allowed these devices to be used as laser sources and integrated biosensors.10
A unique sub-class of resonators is the whispering gallery mode optical microcavity. In these devices, the light is confined in circular orbits at the periphery. Therefore, the field is not completely confined within the device, but evanesces into the environment. Whispering gallery mode optical cavities have demonstrated some of the highest quality factors of any optical resonant cavity to date.9,11 Therefore, these devices are used throughout science and engineering, including in fundamental physics studies and in telecommunications as well as in biodetection experiments. 3-7,12
Optical microcavities can be fabricated from a wide range of materials and in a wide variety of geometries. A few examples include silica and silicon microtoroids, silicon, silicon nitride, and silica microdisks, micropillars, and silica and polymer microrings.13-17 The range in quality factor (Q) varies as dramatically as the geometry. Although both geometry and high Q are important considerations in any field, in many applications, there is far greater leverage in boosting device performance through Q enhancement. Among the numerous options detailed previously, the silica microsphere and the silica microtoroid resonator have achieved some of the highest Q factors to date.1,9 Additionally, as a result of the extremely low optical loss of silica from the visible through the near-IR, both microspheres and microtoroids are able to maintain their Q factors over a wide range of testing wavelengths.18 Finally, because silica is inherently biocompatible, it is routinely used in biodetection experiments.
In addition to high material absorption, there are several other potential loss mechanisms, including surface roughness, radiation loss, and contamination loss.2 Through an optimization of the device size, it is possible to eliminate radiation losses, which arise from poor optical field confinement within the device. Similarly, by storing a device in an appropriately clean environment, contamination of the surface can be minimized. Therefore, in addition to material loss, surface scattering is the primary loss mechanism of concern.2,8
In silica devices, surface scattering is minimized by using a laser reflow technique, which melts the silica through surface tension induced reflow. While spherical optical resonators have been studied for many years, it is only with recent advances in fabrication technologies that researchers been able to fabricate high quality silica optical toroidal microresonators (Q&gt;100 million) on a silicon substrate, thus paving the way for integration with microfluidics.1
The present series of protocols details how to fabricate both silica microsphere and microtoroid resonant cavities. While silica microsphere resonant cavities are well-established, microtoroid resonant cavities were only recently invented.1 As many of the fundamental methods used to fabricate the microsphere are also used in the more complex microtoroid fabrication procedure, by including both in a single protocol it will enable researchers to more easily trouble-shoot their experiments.

We describe the use of a carbon dioxide laser reflow technique to fabricate silica resonant cavities, including free-standing microspheres and on-chip microtoroids. The reflow method removes surface imperfections, allowing long photon lifetimes within both devices. The resulting devices have ultra high quality factors, enabling applications ranging from telecommunications to biodetection.

Fabricação de Sílica Ultra microresonators alto fator de qualidade

Whispering gallery resonant cavities confine light in circular orbits at their periphery.1-2 The photon storage lifetime in the cavity, quantified by the ...

Engenharia

Fabrication And Characterization Of Photonic Crystal Slow Light Waveguides And Cavities

Slow light has been one of the hot topics in the photonics community in the past decade, generating great interest both from a fundamental point of view and for its considerable potential for practical applications. Slow light photonic crystal waveguides, in particular, have played a major part and have been successfully employed for delaying optical signals1-4 and the enhancement of both linear5-7 and nonlinear devices.8-11
Photonic crystal cavities achieve similar effects to that of slow light waveguides, but over a reduced band-width. These cavities offer high Q-factor/volume ratio, for the realization of optically12 and electrically13 pumped ultra-low threshold lasers and the enhancement of nonlinear effects.14-16 Furthermore, passive filters17 and modulators18-19 have been demonstrated, exhibiting ultra-narrow line-width, high free-spectral range and record values of low energy consumption.
To attain these exciting results, a robust repeatable fabrication protocol must be developed. In this paper we take an in-depth look at our fabrication protocol which employs electron-beam lithography for the definition of photonic crystal patterns and uses wet and dry etching techniques. Our optimised fabrication recipe results in photonic crystals that do not suffer from vertical asymmetry and exhibit very good edge-wall roughness. We discuss the results of varying the etching parameters and the detrimental effects that they can have on a device, leading to a diagnostic route that can be taken to identify and eliminate similar issues.
The key to evaluating slow light waveguides is the passive characterization of transmission and group index spectra. Various methods have been reported, most notably resolving the Fabry-Perot fringes of the transmission spectrum20-21 and interferometric techniques.22-25 Here, we describe a direct, broadband measurement technique combining spectral interferometry with Fourier transform analysis.26 Our method stands out for its simplicity and power, as we can characterise a bare photonic crystal with access waveguides, without need for on-chip interference components, and the setup only consists of a Mach-Zehnder interferometer, with no need for moving parts and delay scans.
When characterising photonic crystal cavities, techniques involving internal sources21 or external waveguides directly coupled to the cavity27 impact on the performance of the cavity itself, thereby distorting the measurement. Here, we describe a novel and non-intrusive technique that makes use of a cross-polarised probe beam and is known as resonant scattering (RS), where the probe is coupled out-of plane into the cavity through an objective. The technique was first demonstrated by McCutcheon et al.28 and further developed by Galli et al.29

Use of photonic crystal slow light waveguides and cavities has been widely adopted by the photonics community in many differing applications. Therefore fabrication and characterization of these devices are of great interest. This paper outlines our fabrication technique and two optical characterization methods, namely: interferometric (waveguides) and resonant scattering (cavities).

Fabricação e caracterização de guias de onda de luz de cristal fotônico lentas e cavidades

Slow light has been one of the hot topics in the photonics community in the past decade, generating great interest both from a fundamental point of view ...

Microwave Photonics Systems Based on Whispering-gallery-mode Resonators

Microwave photonics systems rely fundamentally on the interaction between microwave and optical signals. These systems are extremely promising for various areas of technology and applied science, such as aerospace and communication engineering, sensing, metrology, nonlinear photonics, and quantum optics. In this article, we present the principal techniques used in our lab to build microwave photonics systems based on ultra-high Q whispering gallery mode resonators. First detailed in this article is the protocol for resonator polishing, which is based on a grind-and-polish technique close to the ones used to polish optical components such as lenses or telescope mirrors. Then, a white light interferometric profilometer measures surface roughness, which is a key parameter to characterize the quality of the polishing. In order to launch light in the resonator, a tapered silica fiber with diameter in the micrometer range is used. To reach such small diameters, we adopt the "flame-brushing" technique, using simultaneously computer-controlled motors to pull the fiber apart, and a blowtorch to heat the fiber area to be tapered. The resonator and the tapered fiber are later approached to one another to visualize the resonance signal of the whispering gallery modes using a wavelength-scanning laser. By increasing the optical power in the resonator, nonlinear phenomena are triggered until the formation of a Kerr optical frequency comb is observed with a spectrum made of equidistant spectral lines. These Kerr comb spectra have exceptional characteristics that are suitable for several applications in science and technology. We consider the application related to ultra-stable microwave frequency synthesis and demonstrate the generation of a Kerr comb with GHz intermodal frequency.

The customized techniques developed in our lab to build microwave photonics systems based on ultra-high Q whispering gallery mode resonators are presented. The protocols to obtain and characterize these resonators are detailed, and an explanation of some of their applications in microwave photonics is given.

Microwave Systems Fotônica Baseado Ressonadores-gallery de modo Whispering

Microwave photonics systems rely fundamentally on the interaction between microwave and optical signals. These systems are extremely promising for various ...

Fabrication of Spatially Confined Complex Oxides

Complex materials such as high Tc superconductors, multiferroics, and colossal magnetoresistors have electronic and magnetic properties that arise from the inherent strong electron correlations that reside within them. These materials can also possess electronic phase separation in which regions of vastly different resistive and magnetic behavior can coexist within a single crystal alloy material. By reducing the scale of these materials to length scales at and below the inherent size of the electronic domains, novel behaviors can be exposed. Because of this and the fact that spin-charge-lattice-orbital order parameters each involve correlation lengths, spatially reducing these materials for transport measurements is a critical step in understanding the fundamental physics that drives complex behaviors. These materials also offer great potential to become the next generation of electronic devices 1-3. Thus, the fabrication of low dimensional nano- or micro-structures is extremely important to achieve new functionality. This involves multiple controllable processes from high quality thin film growth to accurate electronic property characterization. Here, we present fabrication protocols of high quality microstructures for complex oxide manganite devices. Detailed descriptions and required equipment of thin film growth, photo-lithography, and wire-bonding are presented.

We describe the use of pulsed laser deposition (PLD), photolithography and wire-bonding techniques to create micrometer scale complex oxides devices. The PLD is utilized to grow epitaxial thin films. Photolithography and wire-bonding techniques are introduced to create practical devices for measurement purposes.

Fabricação de óxidos complexos espacialmente confinados

Complex materials such as high Tc superconductors, multiferroics, and colossal magnetoresistors have electronic and magnetic properties that arise from ...

Fabrication and Testing of Microfluidic Optomechanical Oscillators

Cavity optomechanics experiments that parametrically couple the phonon modes and photon modes have been investigated in various optical systems including microresonators. However, because of the increased acoustic radiative losses during direct liquid immersion of optomechanical devices, almost all published optomechanical experiments have been performed in solid phase. This paper discusses a recently introduced hollow microfluidic optomechanical resonator. Detailed methodology is provided to fabricate these ultra-high-Q microfluidic resonators, perform optomechanical testing, and measure radiation pressure-driven breathing mode and SBS-driven whispering gallery mode parametric vibrations. By confining liquids inside the capillary resonator, high mechanical- and optical- quality factors are simultaneously maintained.

Parametric optomechanical excitations have recently been experimentally demonstrated in microfluidic optomechanical resonators by means of optical radiation pressure and stimulated Brillouin scattering. This paper describes the fabrication of these microfluidic resonators along with methodologies for generating and verifying optomechanical oscillations.

Fabricação e Teste de microfluídicos optomechanical osciladores

Cavity optomechanics experiments that parametrically couple the phonon modes and photon modes have been investigated in various optical systems including ...

Stimulated Stokes and Antistokes Raman Scattering in Microspherical Whispering Gallery Mode Resonators

Dielectric microspheres can confine light and sound for a length of time through high quality factor whispering gallery modes (WGM). Glass microspheres can be thought as a store of energy with a huge variety of applications: compact laser sources, highly sensitive biochemical sensors and nonlinear phenomena. A protocol for the fabrication of both the microspheres and coupling system is given. The couplers described here are tapered fibers. Efficient generation of nonlinear phenomena related to third order optical non-linear susceptibility &#935;(3) interactions in triply resonant silica microspheres is presented in this paper. The interactions here reported are: Stimulated Raman Scattering (SRS), and four wave mixing processes comprising Stimulated Anti-stokes Raman Scattering (SARS). A proof of the cavity-enhanced phenomenon is given by the lack of correlation among the pump, signal and idler: a resonant mode has to exist in order to obtain the pair of signal and idler. In the case of hyperparametric oscillations (four wave mixing and stimulated anti-stokes Raman scattering), the modes must fulfill the energy and momentum conservation and, last but not least, have a good spatial overlap.

Efficient generation of nonlinear phenomena related to third order optical non-linear susceptibility &#935;(3) interactions in triply resonant silica microspheres is presented in this paper. The interactions here reported are: Stimulated Raman Scattering (SRS), and four wave mixing processes comprising Stimulated Anti-stokes Raman Scattering (SARS).

Estimulada Stokes e Antistokes Raman Scattering em microparticulas Whispering Gallery Modo Resonators

Dielectric microspheres can confine light and sound for a length of time through high quality factor whispering gallery modes (WGM). Glass microspheres ...

Fabrication of Nanopillar-Based Split Ring Resonators for Displacement Current Mediated Resonances in Terahertz Metamaterials

Terahertz (THz) split ring resonator (SRR) metamaterials (MMs) has been studied for gas, chemical, and biomolecular sensing applications because the SRR is not affected by environmental characteristics such as the temperature and pressure surrounding the resonator. Electromagnetic radiation in THz frequencies is biocompatible, which is a critical condition especially for the application of the biomolecular sensing. However, the quality factor (Q-factor) and frequency responses of traditional thin-film based split ring resonator (SRR) MMs are very low, which limits their sensitivities and selectivity as sensors. In this work, novel nanopillar-based SRR MMs, utilizing displacement current, are designed to enhance the Q-factor up to 450, which is around 45 times higher than that of traditional thin-film-based MMs. In addition to the enhanced Q-factor, the nanopillar-based MMs induce a larger frequency shifts (17 times compared to the shift obtained by the traditional thin-film based MMs). Because of the significantly enhanced Q-factors and frequency shifts as well as the property of biocompatible radiation, the THz nanopillar-based SRR are ideal MMs for the development of biomolecular sensors with high sensitivity and selectivity without inducing damage or distortion to biomaterials. A novel fabrication process has been demonstrated to build the nanopillar-based SRRs for displacement current mediated THz MMs. A two-step gold (Au) electroplating process and an atomic layer deposition (ALD) process are used to create sub-10 nm scale gaps between Au nanopillars. Since the ALD process is a conformal coating process, a uniform aluminum oxide (Al2O3) layer with nanometer-scale thickness can be achieved. By sequentially electroplating another Au thin film to fill the spaces between Al2O3 and Au, a close-packed Au-Al2O3-Au structure with nano-scale Al2O3 gaps can be fabricated. The size of the nano-gaps can be well defined by precisely controlling the deposition cycles of the ALD process, which has an accuracy of 0.1 nm.

A protocol for the design and fabrication of a novel nanopillar-based split ring resonator (SRR) is presented.

Fabricação de ressonadores anel de divisão Nanopillar-base para o deslocamento atuais mediada Ressonâncias em Terahertz Metamaterials

Terahertz (THz) split ring resonator (SRR) metamaterials (MMs) has been studied for gas, chemical, and biomolecular sensing applications because the SRR ...

Fabrication of Polymer Microspheres for Optical Resonator and Laser Applications

This paper describes three methods of preparing fluorescent microspheres comprising &#960;-conjugated or non-conjugated polymers: vapor diffusion, interface precipitation, and mini-emulsion. In all methods, well-defined, micrometer-sized spheres are obtained from a self-assembling process in solution. The vapor diffusion method can result in spheres with the highest sphericity and surface smoothness, yet the types of the polymers able to form these spheres are limited. On the other hand, in the mini-emulsion method, microspheres can be made from various types of polymers, even from highly crystalline polymers with coplanar, &#960;-conjugated backbones. The photoluminescent (PL) properties from single isolated microspheres are unusual: the PL is confined inside the spheres, propagates at the circumference of the spheres via the total internal reflection at the polymer/air interface, and self-interferes to show sharp and periodic resonant PL lines. These resonating modes are so-called "whispering gallery modes" (WGMs). This work demonstrates how to measure WGM PL from single isolated spheres using the micro-photoluminescence (&#181;-PL) technique. In this technique, a focused laser beam irradiates a single microsphere, and the luminescence is detected by a spectrometer. A micromanipulation technique is then used to connect the microspheres one by one and to demonstrate the intersphere PL propagation and color conversion from coupled microspheres upon excitation at the perimeter of one sphere and detection of PL from the other microsphere. These techniques, &#181;-PL and micromanipulation, are useful for experiments on micro-optic application using polymer materials.

Protocols for the synthesis of microspheres from polymers, the manipulation of microspheres, and micro-photoluminescence measurements are presented.

Fabricação de Microsferas de Polímeros para Resonadores Ópticos e Aplicações Laser

This paper describes three methods of preparing fluorescent microspheres comprising &#960;-conjugated or non-conjugated polymers: vapor diffusion, ...

Design and Characterization Methodology for Efficient Wide Range Tunable MEMS Filters

Here, we demonstrate the advantages of the laser Doppler vibrometer (LDV) over conventional techniques (the network analyzer), as well as the techniques to create an application-based microelectromechanical systems (MEMS) filter and how to use it efficiently (i.e., tuning the tuning-capability and avoiding both failure and stiction). LDV enables crucial measurements that are impossible with the network analyzer, such as higher mode detection (highly sensitive biosensor application) and resonance measurement for very small devices (fast prototyping). Accordingly, LDV was used to characterize the frequency tuning range and resonance frequency at different modes of the MEMS filters built for this study. This wide range frequency tuning mechanism is based simply on Joule heating from the embedded heaters and relatively high thermal stress with respect to the temperature of a fixed-fixed beam. However, we demonstrate that another limitation of this method is the resulting high thermal stress, which can burn the devices. Further improvement was achieved and shown for the first time in this study, such that the tuning capability was increased by 32% through an increase in the applied DC bias voltage (25 V to 35 V) between the two adjacent beams. This important finding eliminates the need for the extra Joule heating at the wider frequency tuning range. Another possible failure is through stiction and requirement of structure optimization: We propose a simple and easy technique of low frequency square wave signal application that can successfully separate the beams and eliminates the need for the more sophisticated and complicated methods given in the literature. The above findings necessitate a design methodology, and so we also provide an application-based design.

A protocol for a fixed-fixed beam design using a laser Doppler vibrometer (LDV), including the measurement of frequency tuning, modification of tuning capability, and avoidance of device failure and stiction, is presented. The superiority of the LDV method over the network analyzer is demonstrated due to its higher mode capability.

Projeto e metodologia de caracterização para filtros de MEMS sintonizável eficiente gama

Here, we demonstrate the advantages of the laser Doppler vibrometer (LDV) over conventional techniques (the network analyzer), as well as the techniques ...

Rapid Repetition Rate Fluctuation Measurement of Soliton Crystals in a Microresonator

Temporal solitons have attracted great interest in the past decades for their behavior in a steady state, where the dispersion is balanced by the nonlinearity in a propagation Kerr medium. The development of dissipative Kerr solitons (DKSs) in high-Q microcavities drives a novel, compact, chip-scale soliton source. When DKSs serve as femtosecond pulses, the repetition rate fluctuation can be applied to ultrahigh precision metrology, high-speed optical sampling, and optical clocks, etc. In this paper, the rapid repetition rate fluctuation of soliton crystals (SCs), a special state of DKSs where particle-like solitons are tightly packed and fully occupy a resonator, is measured based on the well-known delayed self-heterodyne method. The SCs are generated using a thermal-controlled method. The pump is a frequency fixed laser with a linewidth of 100 Hz. The integral time in frequency fluctuation measurements is controlled by the length of the delay fiber. For a SC with a single vacancy, the repetition rate fluctuations are ~53.24 Hz within 10 &#181;s and ~509.32 Hz within 125 &#181;s, respectively.

Here, we present a protocol to generate soliton crystals in a butterfly-packaged micro-ring resonator using a thermal tuned method. Further, the repetition rate fluctuations of a soliton crystal with a single vacancy are measured using a delayed self-heterodyne method.