Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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07:24 min
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May 10th, 2021
DOI :
May 10th, 2021
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Rozdziały w tym wideo
0:04
Introduction
0:59
Transmission Electron Microscopy (TEM) Alignment for Beam-Rocking
2:36
Incident Beam Collimation and Pivot Point Setup
3:47
Electron-Channeling Pattern (ECP) Acquisition
4:30
Energy-Dispersive X-Ray Analysis
5:10
Results: Representative ECP and ICP Emission Imaging
6:46
Conclusion
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