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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

9.4K Views

11:33 min

January 19th, 2018

DOI :

10.3791/56861-v

January 19th, 2018


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Nanosecond resolved Scanning Tunneling Microscopy

Rozdziały w tym wideo

0:05

Title

0:52

Initial Setup of Microscope and Experiments

2:05

Preparation of the H-Si(100)-(2x1) Reconstruction

4:20

Assessing the Quality of the Pump-probe Pulses at the Tunnel Junction

6:32

Experiment 1: Time-resolved Scanning Tunneling Spectroscopy

7:55

Experiment 2: Time-resolved STM Measurements of Relaxation Dynamics

8:47

Experiment 3: Time-resolved STM Measurements of Excitation Dynamics

9:27

Results: Investigation of Single Dopant Change Dynamics

10:43

Conclusion

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