In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
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09:49 min
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May 13th, 2020
DOI :
May 13th, 2020
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Rozdziały w tym wideo
0:04
Introduction
0:52
Fabrication Process and Electrical Characterization
2:33
Biasing Chip Mounting on Gridbar
3:14
Lamella Preparation and Biasing Chip Mounting
6:50
In Situ Transmission Electron Microscopy (TEM)
7:42
Results: Representative In Situ Electrical TEM
9:04
Conclusion
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