Taarna Studemund ve Hagen Wendler&#39;a, deneysel düzenin fotoğraflarını çekerken ve resim yayınlamaya hazır oldukları için teşekkür ederiz. Ayrıca, örnek hazırlama için Anne Hildebrandt&#39;a ve kanıta dayalı okumalar için Sreedhar Unnikrishnakurup, Alexander Battig ve Felix Fritzsche&#39;ye teşekkür etmek istiyoruz.

<ol>
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P. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Introduction+to+NDT+by+active+infrared+thermography.">Introduction to NDT by active infrared thermography.</a> Mater. Eval. 60 (9), 1060-1073 (2002).</li><li>Li, T., Almond, D. P., Rees, D. A. S. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Crack+imaging+by+scanning+pulsed+laser+spot+thermography.">Crack imaging by scanning pulsed laser spot thermography.</a> Ndt&amp;E Int. 44 (2), 216-225 (2011).</li><li>Lugin, S. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Detection+of+hidden+defects+by+lateral+thermal+flows.">Detection of hidden defects by lateral thermal flows.</a> Ndt&amp;E Int. 56, 48-55 (2013).</li><li>Li, T., Almond, D. P., Rees, D. A. S. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Crack+imaging+by+scanning+laser-line+thermography+and+laser-spot+thermography.">Crack imaging by scanning laser-line thermography and laser-spot thermography.</a> Meas. Sci. Technol. 22 (3), (2011).</li><li>Pech-May, N. W., Oleaga, A., Mendioroz, A., Salazar, A. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Fast+Characterization+of+the+Width+of+Vertical+Cracks+Using+Pulsed+Laser+Spot+Infrared+Thermography.">Fast Characterization of the Width of Vertical Cracks Using Pulsed Laser Spot Infrared Thermography.</a> Journal of Nondestructive Evaluation. 35 (2), 22 (2016).</li><li>Thiel, E., Kreutzbruck, M., Ziegler, M., Douglass, M. R., King, P. S., Lee, B. L. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=.">.</a> Proc. SPIE 9761. , (2016).</li><li>Thiel, E., Kreutzbruck, M., Ziegler, M. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=.">.</a> Proc. WCNDT 2016. , 6 (2016).</li><li>Mandelis, A. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=.">.</a> Diffusion-Wave Fields: mathematical methods and Green functions. , (2001).</li><li>Almond, D., Patel, P. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=.">.</a> Photothermal Science and Techniques. 10, (1996).</li><li>Salazar, A. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Energy+propagation+of+thermal+waves.">Energy propagation of thermal waves.</a> Eur. J. Phys. 27 (6), 1349-1355 (2006).</li><li>Bennett, C. A., Patty, R. R. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Thermal+wave+interferometry:+a+potential+application+of+the+photoacoustic+effect.">Thermal wave interferometry: a potential application of the photoacoustic effect.</a> Appl. Opt. 21 (1), 49-54 (1982).</li><li>Busse, G. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Stereoscopic+depth+analysis+by+thermal+wave+transmission+for+nondestructive+evaluation.">Stereoscopic depth analysis by thermal wave transmission for nondestructive evaluation.</a> Appl. Phys. Lett. 42 (4), 366 (1983).</li><li>Holtmann, N., Artzt, K., Gleiter, A., Strunk, H. P., Busse, G. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Iterative+improvement+of+Lockin-thermography+results+by+temporal+and+spatial+adaption+of+optical+excitation.">Iterative improvement of Lockin-thermography results by temporal and spatial adaption of optical excitation.</a> Qirt J. 9 (2), 167-176 (2012).</li><li>Pribe, J. D., Thandu, S. C., Yin, Z., Kinzel, E. C. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Toward+DMD+illuminated+spatial-temporal+modulated+thermography.">Toward DMD illuminated spatial-temporal modulated thermography.</a> Proc. SPIE 9861. , (2016).</li><li>Ravichandran, A. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=.">.</a> Spatial and temporal modulation of heat source using light modulator for advanced thermography. , (2015).</li><li>. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=.">.</a> DLP 0.55 XGA Series 450 DMD. , (2015).</li><li>. DLP LightCommander Control Software - User Manual Available from: <a target="_blank" href="https://support.logicpd.com/ProductDownloads/LegacyProducts/DLPLightCommander.aspx?_sw_csrfToken=318b0448">https://support.logicpd.com/ProductDownloads/LegacyProducts/DLPLightCommander.aspx?_sw_csrfToken=318b0448</a> (2011)</li><li>Moench, H., et al. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=High-power+VCSEL+systems+and+applications.">High-power VCSEL systems and applications.</a> Proc. SPIE 9348. , (2015).</li></ol>

Yazarların açıklayacak bir şeyi yok.

Sunulan protokol, yüzeye dik doğrultuda yapay alt yüzey kusurlarının nasıl bulunacağını açıklamaktadır. Yöntemin ana fikri yeraltı kusuruyla etkileşime giren müdahale eden termal dalga alanları oluşturmaktır. En önemli adımlar şunlardır: (i) numune yüzeyinde iki adet değişen yüksek güçlü aydınlatma örneği oluşturmak için bir SLM&#39;yi bir diyod lazeri ile birleştirmek; Bu modeller fototermal olarak tutarlı termal dalga alanlarına dönüştürülür, (ii) yüzey altı bir kusurla et...

Lazerle projelendirilen fototermal termografi (LPPT) yöntemi, test numunesinin hacmine gömülü olan ve ağırlıklı olarak yüzeyine dik olan yüzey altı kusurların yerini belirlemek için kullanılır. Yöntem Şekil 1b&#39;de gösterildiği gibi aynı gerilme ve frekanstaki iki anti-fazlı termal dalga alanının yıkıcı etkileşimini kullanır. İzotropik kusursuz malzemelerde, termal dalgalar, simetri düzleminde tutarlı süperpozisyonla yıkıcı olarak nötralize edilir ( yani, sıfır sıcaklık osilasyonu). Yüzey altı bir kusurlu bir materyal durumunda, yöntem, geçici ısı akışı ile bu kusur arasındaki yanal ( yani düzlem içi) bileşenlerin etkileşiminden yararlanmaktadır. Bu etkileşim, numune yüzeyindeki simetri hattında yeniden oluşturulmuş salınımlı bir sıcaklık uzamasında ölçülebilir. Şimdi, örnek içeren kusur, üst üste binmiş termal dalga alanı taranıyor veSıcaklık uzama seviyesi numune pozisyonuyla ilişkili olarak ölçülür. Simetri sebebiyle, defektif simetri düzlemi geçtiğinde yıkıcı girişim koşulları bir kez daha karşılanır; Bu, kusuru çok hassas bir şekilde tespit etmemizi sağlar. Dahası, yıkıcı girişimin maksimum bozulma seviyesi kusurun derinliği ile korele olduğundan, sıcaklık taraması 1&#39;i analiz ederek derinliğini belirlemek mümkündür. LPPT, geçici ısınmanın aktif olarak üretildiği ve bunun sonucunda da geçici ısı dağılımının termal bir IR kamera ile ölçülmekte olduğu iyi kurulmuş tahribatsız bir yöntem olan aktif termografi metodolojisine atanabilir. Genel olarak, bu metodolojinin hassasiyeti, geçici ısı akışına esas olarak dik olan kusurlar ile sınırlıdır. Dahası, geçici geçici ısı iletim denklemi parabolik kısmi diferensiyeldirDenklemde, hacimdeki ısı akışı şiddetle azaltılır. Sonuç olarak, aktif termografi metodolojisinin sondalama derinliği, genellikle milimetre aralığında, yakın bir yüzey bölgesi ile sınırlıdır. En yaygın aktif termografi tekniklerinden ikisi darbeli ve kilitlenmiş termografidir. Düzlemsel optik yüzey aydınlatması 2&#39;den dolayı hızlıdır, ancak yüzeye dik olan geçici ısı akışına neden olurlar. Bu nedenle, bu tekniklerin hassasiyeti, ağırlıklı olarak ısıtılmış numune yüzeyine paralel ( örn. Delaminasyonlar veya boşluklar) yönlendirilmiş kusurlar ile sınırlıdır. Darbeli termografi için ampirik bir kural &quot;en küçük saptanabilir kusurun yarıçapı, yüzeyin altındaki derinliğinden en az bir ila iki kat daha büyük olmalıdır&quot; şeklindedir. Dikey olarak yönlendirilmiş bir kusur ( örneğin bir çatlak) ile ısı akışı arasındaki etkin etkileşim alanını arttırmak için, ısı akışının yönüdeğişti. Örneğin, doğrusal veya dairesel bir noktaya sahip odaklanmış bir lazer kullanarak lokal uyarma, dikey kusur 4 , 5 , 6 , 7 ile etkili bir şekilde etkileşime girebilen bir düzlem içi bileşen ile bir ısı akışı üretir. Sunulan yöntemde, alt yüzeydeki kusurları tespit etmek için yanal ısı akışı bileşenlerini de kullanıyoruz, ancak termal dalgaların üst üste binebileceği gerçeğini kullanıyoruz, oysa kusurlar, özellikle dikey olarak yönlendirilmiş olanlar, bu üst üste binmeyi bozuyor. Bu yolla sunum yöntemi, referans dışı, simetrik ve çok hassas bir yöntemi andırır; zira suni yüzey altı kusurlarını bir 8 , 9&#39;un çok altındaki bir genişlik / derinlik oranında algılamak mümkündür. Şimdiye kadar, yeterli miktarda enerji sağlayan iki anti fazlı termal dalga alanı oluşturmak zordu. Bu b&#39;ye ulaştıkY Lazer sisteminin yüksek optik gücünü, SLM&#39;nin mekansal ve zamansal çözünürlüğüyle ( Şekil 2&#39;ye bakınız) bir yüksek güçlü projektöre birleştirmeye imkân veren bir yüksek ışıklı diyot lazere uzamsal ışık modülatörü (SLM) bağlamak . Termal dalga alanları, iki anti-fazlı sinüzoidal modüle çizgi deseninin fototermal dönüşümüyle yansıtılan görüntünün piksel parlaklığı üzerinden yaratılmıştır (bkz. Şekil 2 , Şekil 1a ). Bu, numunenin yüzeyinin yapılandırılmış ısıtılmasına yol açar ve iyi tanımlanmış yıkıcı olarak müdahale eden termal dalga alanlarına neden olur. Yer altı bir kusur bulmak için, tahrip edici çıkarsamanın bozulması, bir IR kamera kullanarak yüzeyde bir sıcaklık osilasyonu olarak ölçülür. Termal dalga terimi tartışmalıdır çünkü termal dalgalar ısı yayılımının yayıcı karakteri nedeniyle enerjiyi nakletmiyor. Hala, dalga benzeri bir davranış vardır hea<html> Periyodik olarak, gerçek dalgalar ile difüzyon süreçleri arasındaki benzerlikleri kullanmamıza izin vererek 10 , 11 , 12 . Böylece, bir termal dalga, yayılma yönünde oldukça sönümlenmiş ancak zamanla periyodik olarak anlaşılabilir ( Şekil 1b ). Karakteristik termal yayılma uzunluğu <img alt="Denklem 1" src="/files/ftp_upload/55733/55733eq1.jpg" /> Malzeme özellikleri (termal iletkenlik k , ısı kapasitesi c p ve yoğunluk ρ ) ve uyarma frekansı ƒ ile açıklanmaktadır. Termal dalga şiddetle çürüme olmasına rağmen, dalga yapısı, numunenin özelliklerini anlamak için uygulanabilir. Katmanların kalınlığını belirlemek için ilk termal dalga girişim uygulaması uygulandı. Metodumuzun aksine, parazit etkisi derinlik boyutunda kullanılmıştır ( yani , yüzeye dik olarak)<html> Ref &quot;&gt; 13. Bir lazer ışını ayırarak etkileşim boyutunu ikinci bir boyuta kadar genişletmek için yüzey altı kusurlarını boyutlandırmak için termal dalga girişim kullanıldı 14 Bununla birlikte, bu yöntem iletim konfigürasyonunda uygulanmıştır, bu da penetrasyon ile sınırlandırılmıştır Termal dalgaların derinliği Tek bir lazer kaynağı kullanılmadığı için bu yöntem yapısal paraziti uygular, yani kusursuz bir referansa ihtiyaç duyulur. Termal dalga girişimini kullanma fikrinin yanı sıra, Geçici olarak kontrol edilen ısıtma, Holtmann ve diğerleri tarafından, optik çıkış gücünde ciddi derecede sınırlı yerleşik ışık kaynağına sahip değiştirilmemiş bir sıvı kristal ekran (LCD) projektör kullanılarak gerçekleştirildi. [ 15 ] Pribe ve Ravichandran&#39;ın diğer yaklaşımları, Bir lazerin bir SLM&#39;ye ( 16) bağlanmasıyla ,<html> S = &quot;xref&quot;&gt; 17. Burada sunulan protokol, çelik numunelerin yüzeyine dikey olarak yönlendirilmiş yeraltı kusurlarının yerini belirlemek için LPPT yönteminin nasıl uygulanacağını açıklamaktadır. Yöntem erken bir aşamadadır, ancak önerilen yaklaşımı onaylayacak kadar güçlüdür; Bununla birlikte, deney düzeneğinin erişilebilir optik çıkış gücü açısından hala sınırlıdır. Optik çıkış gücünün artması bir zorluk olmaya devam ettiği için sunulan yöntem suni elektrik boşaltma ile işlenmiş çentikler içeren kaplamalı çelik üzerine uygulanmaktadır. Yine de, protokolün homojen bir yapılandırılmış aydınlatma üreten, yıkıcı termal dalga girişiminin ön koşullarını yerine getiren ve kusurun yerini tespit eden en önemli ve kritik adımları halen daha zorlu kusurlar için de geçerlidir. Yönetim miktarı termik yayılma uzunluğu μ olduğu için, LPPT yöntemi çok sayıda farklı malzemeye de uygulanabilir. nt &quot;&gt; <img alt="Şekil 1" src="/files/ftp_upload/55733/55733fig1.jpg" /> Şekil 1: Zararlı parazit etkisi ilkesi. ( A ) Deneyler sırasında kullanılan aydınlatma düzeninin şeması. Numune, π&#39;nin bir faz kaydırması ile periyodik olarak aydınlatılan iki desenle uzaysal ve geçici olarak ısıtılır. Kesikli çizgi, her iki desen arasındaki simetri çizgisini temsil eder. Bu çizgi değerlendirme için &quot;tükenme çizgisi&quot; olarak kullanılacaktır. ( B ) Termal ısı iletim denkleminin analitik çözümünden hesaplanan uzamsal ve zamansal olarak çözülen alternatif termal sonuç diyagramı. (A) &#39;nın aydınlatılmasına tepki veren termal dalgaları, P opt 1 = 1.5 W sin (2π 0.125 Hz t ) + 1.5 W ve P opt 2 = 1.5 W sin (2π, 0.125 Hz t + Π) + inşaat çelikleri için 1,5 W ρ </Em&gt; = 7,850 kg / m3, cp = 461 J / (kg.K), k = 54 W / (m.K). Kesikli çizgideki sıcaklık profili, homojen, izotropik malzeme için termal salınım göstermez. <a href="http://ecsource.jove.com/files/ftp_upload/55733/55733fig1large.jpg" target="_blank">Bu rakamın daha büyük bir versiyonunu görmek için lütfen tıklayınız.</a> <img alt="şekil 2" src="/files/ftp_upload/55733/55733fig2.jpg" /> Şekil 2: Aktif termografide kullanılan yapılandırılmış ısıtma ölçüm prensibinin şeması. Bir üst şapka profiline homojenize edilmiş bir Gauss kirişi, Bir Uzaysal Işık Modülatörüne (SLM) uygulanır. SLM kirişi, değiştirilebilir elemanları ve zamana göre anahtarlama hızı ile uzamsal olarak giderir. Her öğe, bir SLM pikseli temsil eder. Bu deneyde SLM, bir dijital mikro ayna cihazı (DMD) &#39;dir. Piksel parlaklığı A&#39;nın zaman deterministik kontrol yazılımı ile modüle edilerek, numune yüzeyiYapılandırılmış bir şekilde ısıtılır. Sunulan deneyde, açısal frekansta ω&#39;da tutarlı şekilde müdahale eden termal dalga alanlarının kaynağı olan iki anti-fazlı hattı (fazlar: φ = 0, π) modüle ederiz. Dalga alanları, yüzeydeki sıcaklık alanını da etkileyen numunenin iç yapısıyla etkileşir. Bu, termal radyasyon ile orta dalga kızıl ötesi kamera ile ölçülür. <a href="http://ecsource.jove.com/files/ftp_upload/55733/55733fig2large.jpg" target="_blank">Bu rakamın daha büyük bir versiyonunu görmek için lütfen tıklayınız.</a>

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		<col />
		<col />
	</colgroup>
	<tbody>
		<tr height="84">
			<td height="84" style="height:84px;width:269px;">500 W diode laser system, 940 nm</td>
			<td style="width:88px;">Laserline</td>
			<td style="width:104px;">LDM 500 - 20</td>
			<td style="width:220px;">Pilot laser class 2 @ 650 nm, diode laser is a class 4 laser system --&#62; special laboratory needed</td>
		</tr>
		<tr height="84">
			<td height="84" style="height:84px;width:269px;">Laser control box</td>
			<td style="width:88px;">Laserline</td>
			<td style="width:104px;">Laser control box LDM</td>
			<td style="width:220px;">Add on to the laser system, used to switch electronically, laser threshold, shutter, laser on 0 V ..5 V TTL</td>
		</tr>
		<tr height="84">
			<td height="84" style="height:84px;width:269px;">Control box scanner</td>
			<td style="width:88px;">Laserline</td>
			<td style="width:104px;"></td>
			<td style="width:220px;">Add on to the laser system, used to adjust the optical output power via analog signal from 0 V..10 V</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:269px;">Fiber Laser Mount 2&#34;, f = 80 mm</td>
			<td style="width:88px;">Laserline</td>
			<td style="width:104px;"></td>
			<td style="width:220px;">Add on to the laser system</td>
		</tr>
		<tr height="84">
			<td height="84" style="height:84px;width:269px;">Multifunction Data Aquisition (DAQ) Device + BNC Terminal</td>
			<td style="width:88px;">National Instruments</td>
			<td style="width:104px;">NI-USB 6251</td>
			<td style="width:220px;">The DAQ card is used to trigger the IR camera,&#160; the DLP Light Commander 5500, control Laser and diode PDA 36A</td>
		</tr>
		<tr height="63">
			<td height="63" style="height:63px;width:269px;">Standard - PC&#160;</td>
			<td style="width:88px;"></td>
			<td style="width:104px;"></td>
			<td style="width:220px;">Control PC - graphic card for two screens, at least 4 x USB, Windows based</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:269px;">BNC cabel</td>
			<td style="width:88px;"></td>
			<td style="width:104px;"></td>
			<td style="width:220px;">Standard cable</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:269px;">HDMI cable</td>
			<td style="width:88px;"></td>
			<td style="width:104px;"></td>
			<td style="width:220px;">Standard cable</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:269px;">Micro USB to USB cable</td>
			<td style="width:88px;"></td>
			<td style="width:104px;"></td>
			<td style="width:220px;">Standard cable</td>
		</tr>
		<tr height="42">
			<td height="42" style="height:42px;width:269px;">LabVIEW 2013 SP1 Development System</td>
			<td style="width:88px;">National Instruments</td>
			<td style="width:104px;"></td>
			<td style="width:220px;">Development environment for device control</td>
		</tr>
		<tr height="42">
			<td height="42" style="height:42px;width:269px;">LPPT control software</td>
			<td style="width:88px;">BAM</td>
			<td style="width:104px;"></td>
			<td style="width:220px;">part of the LPPT software package by LabVIEW 2013 SP1</td>
		</tr>
		<tr height="42">
			<td height="42" style="height:42px;width:269px;">LPPT intensity&#160; software</td>
			<td style="width:88px;">BAM</td>
			<td style="width:104px;"></td>
			<td style="width:220px;">part of the LPPT software package by LabVIEW 2013 SP1</td>
		</tr>
		<tr height="42">
			<td height="42" style="height:42px;width:269px;">LPPT laser control software</td>
			<td style="width:88px;">BAM</td>
			<td style="width:104px;"></td>
			<td style="width:220px;">part of the LPPT software package by LabVIEW 2013 SP1</td>
		</tr>
		<tr height="42">
			<td height="42" style="height:42px;width:269px;">Matlab 2016b</td>
			<td style="width:88px;">MathWorks</td>
			<td style="width:104px;"></td>
			<td style="width:220px;">Postprocessing of the measurement data</td>
		</tr>
		<tr height="42">
			<td height="42" style="height:42px;width:269px;">LPPT postprocessing software</td>
			<td style="width:88px;">BAM</td>
			<td style="width:104px;"></td>
			<td style="width:220px;">Postprocessing of the measurement data</td>
		</tr>
		<tr height="42">
			<td height="42" style="height:42px;width:269px;">IR camera control PC&#160;</td>
			<td style="width:88px;">InfraTec</td>
			<td style="width:104px;"></td>
			<td style="width:220px;">Control PC is supplied by camera distributor</td>
		</tr>
		<tr height="42">
			<td height="42" style="height:42px;width:269px;">IR camera control software</td>
			<td style="width:88px;">InfraTec</td>
			<td style="width:104px;">Irbis 3 Professional</td>
			<td style="width:220px;"></td>
		</tr>
		<tr height="84">
			<td height="84" style="height:84px;width:269px;">InfraTec SDK</td>
			<td style="width:88px;">InfraTec</td>
			<td style="width:104px;"></td>
			<td style="width:220px;">Dynamic Link Library as interface between the native data aquisition format of Infratec and Matlab</td>
		</tr>
		<tr height="105">
			<td height="105" style="height:105px;width:269px;">IR camera</td>
			<td style="width:88px;">InfraTec</td>
			<td style="width:104px;">Image IR 8300</td>
			<td style="width:220px;">640 x 512, cooled InSb detector, wavelength 2 &#181;m..5.7 &#181;m, noise = 20 mK + accessories (LAN cable, Digital in/out cable, space ring, power supply, case)&#160;</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:269px;">Tripod</td>
			<td style="width:88px;">Manfrotto</td>
			<td style="width:104px;">161MK2B</td>
			<td style="width:220px;"></td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:269px;">IR camera mount</td>
			<td style="width:88px;">Manfrotto</td>
			<td align="right" style="width:104px;">405</td>
			<td style="width:220px;"></td>
		</tr>
		<tr height="84">
			<td height="84" style="height:84px;width:269px;">Projector development kit (PDK) for digital light processing (DLP) technology (DLP Light Commander 5500)</td>
			<td style="width:88px;">Logic PD</td>
			<td style="width:104px;">DLP-LC-DLP5500-10R</td>
			<td style="width:220px;">DLP5500 Digital Micromirror Device from Texas Instruments included , light engine and case need to be disassembed</td>
		</tr>
		<tr height="63">
			<td height="63" style="height:63px;width:269px;">PDK control software</td>
			<td style="width:88px;">Logic PD</td>
			<td style="width:104px;"></td>
			<td style="width:220px;">Included when delivered, DLP Light Commander control software</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:269px;">Mechanical platform for the PDK</td>
			<td style="width:88px;">BAM</td>
			<td style="width:104px;"></td>
			<td style="width:220px;">Self made (140 x 230 x 420) mm</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:269px;">Power meter control unit</td>
			<td style="width:88px;">Ophir</td>
			<td style="width:104px;">Vega</td>
			<td style="width:220px;">USB Interface</td>
		</tr>
		<tr height="63">
			<td height="63" style="height:63px;width:269px;">30 W power meter head&#160;</td>
			<td style="width:88px;">Ophir</td>
			<td style="width:104px;">30(150)A-LP1-18</td>
			<td style="width:220px;">Power meter head to determine Transmission of the projector system</td>
		</tr>
		<tr height="42">
			<td height="42" style="height:42px;width:269px;">500 W power meter head</td>
			<td style="width:88px;">Ophir</td>
			<td style="width:104px;">FL500A</td>
			<td style="width:220px;">Power meter for process supervision</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:269px;">Motion controller</td>
			<td style="width:88px;">Newport</td>
			<td style="width:104px;">ESP301</td>
			<td style="width:220px;">with USB Interface</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:269px;">Translation stage</td>
			<td style="width:88px;">Newport</td>
			<td style="width:104px;">M-ILS200CC</td>
			<td style="width:220px;">Connected to ESP301</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:269px;">Photodiode with amplifier</td>
			<td style="width:88px;">Thorlabs</td>
			<td style="width:104px;">PDA 36A-EC</td>
			<td style="width:220px;">1&#34; mount</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:269px;">Reflective filter ND1</td>
			<td style="width:88px;">Thorlabs</td>
			<td style="width:104px;">ND10A</td>
			<td style="width:220px;">to be mounted to the PDA 36A</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:269px;">Pinhole 1&#34;</td>
			<td style="width:88px;">Thorlabs</td>
			<td style="width:104px;">P1000S</td>
			<td style="width:220px;">to be mounted to the PDA 36A</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:269px;">Optical aluminium breadboard&#160;</td>
			<td style="width:88px;">Thorlabs</td>
			<td style="width:104px;">MB60120/M</td>
			<td style="width:220px;">(1200 mm x 900 mm) base&#160;</td>
		</tr>
		<tr height="42">
			<td height="42" style="height:42px;width:269px;">Plano Convex Lens f = 200 mm</td>
			<td style="width:88px;">Thorlabs</td>
			<td style="width:104px;">LA1979-B</td>
			<td style="width:220px;">Coated for IR, first telescope lens</td>
		</tr>
		<tr height="42">
			<td height="42" style="height:42px;width:269px;">Plano Convex Lens f = 75 mm</td>
			<td style="width:88px;">Thorlabs</td>
			<td style="width:104px;">LA1145-B</td>
			<td style="width:220px;">Coated for IR, second telescope lens</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:269px;">xy-translation stage</td>
			<td style="width:88px;">Newport</td>
			<td style="width:104px;">M401</td>
			<td style="width:220px;">Used for adjusting the telecope</td>
		</tr>
		<tr height="63">
			<td height="63" style="height:63px;width:269px;">Beamsampler</td>
			<td style="width:88px;">Thorlabs</td>
			<td style="width:104px;">BSF20-B&#160;</td>
			<td style="width:220px;">Splits the optical output, used to reduce the optical input for the projector system</td>
		</tr>
		<tr height="42">
			<td height="42" style="height:42px;width:269px;">Mirror</td>
			<td style="width:88px;">Thorlabs</td>
			<td style="width:104px;">BB2-E03</td>
			<td style="width:220px;">Mirror for coupling the beam to the DLP Light Commander</td>
		</tr>
		<tr height="63">
			<td height="63" style="height:63px;width:269px;">Heavy duty lab jack</td>
			<td style="width:88px;">Thorlabs</td>
			<td style="width:104px;">L490</td>
			<td style="width:220px;">Used for the fiber mount and on top of the linear stage to position the sample (2x)</td>
		</tr>
		<tr height="63">
			<td height="63" style="height:63px;width:269px;">PDK-objective&#160;</td>
			<td style="width:88px;">Nikon</td>
			<td style="width:104px;">Nikon AF Nikkor 50 mm 1:1:8:D&#160;</td>
			<td style="width:220px;">Objective for DLP Light Commander, 50 mm</td>
		</tr>
		<tr height="42">
			<td height="42" style="height:42px;width:269px;">Plano Convex Lens f = 100 mm</td>
			<td style="width:88px;">Thorlabs</td>
			<td style="width:104px;">LA1050 -B</td>
			<td style="width:220px;">Lens is attached to the Nikon Objective</td>
		</tr>
		<tr height="105">
			<td height="105" style="height:105px;width:269px;">Bi-Convex Lens f = 60 mm</td>
			<td style="width:88px;">Thorlabs</td>
			<td style="width:104px;">LB1723 -B</td>
			<td style="width:220px;">Lens to be attached to the Nikon objective in order to determine the optical transmission with the 30 W measurement head</td>
		</tr>
		<tr height="42">
			<td height="42" style="height:42px;width:269px;">Square protected gold mirror</td>
			<td style="width:88px;">Thorlabs</td>
			<td style="width:104px;">PFSQ20-03-M01</td>
			<td style="width:220px;"></td>
		</tr>
		<tr height="42">
			<td height="42" style="height:42px;width:269px;">High power IR sensor card</td>
			<td style="width:88px;">Newport</td>
			<td style="width:104px;">F-IRC-HP-M</td>
			<td style="width:220px;">Sensor card to check the optical pathway</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:269px;">2&#34; crosshairs</td>
			<td style="width:88px;">BAM</td>
			<td style="width:104px;"></td>
			<td style="width:220px;">Selfmade</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:269px;">1&#34; crosshairs</td>
			<td style="width:88px;">BAM</td>
			<td style="width:104px;"></td>
			<td style="width:220px;">Selfmade</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:269px;">Bullseye level</td>
			<td style="width:88px;">Thorlabs</td>
			<td style="width:104px;">LCL01</td>
			<td style="width:220px;"></td>
		</tr>
		<tr height="42">
			<td height="42" style="height:42px;width:269px;">Translation Stage</td>
			<td style="width:88px;">Newport</td>
			<td style="width:104px;">M-UMR8.25</td>
			<td style="width:220px;">Used for measuring the beam profile</td>
		</tr>
		<tr height="42">
			<td height="42" style="height:42px;width:269px;">Micrometer screw</td>
			<td style="width:88px;">Newport</td>
			<td style="width:104px;">DM17-25</td>
			<td style="width:220px;">Used with translation stage M-UMR8.25</td>
		</tr>
		<tr height="42">
			<td height="42" style="height:42px;width:269px;">Mounted Zero Aperture Iris</td>
			<td style="width:88px;">Thorlabs</td>
			<td style="width:104px;">&#160;ID75Z/M</td>
			<td style="width:220px;">used to check the optical pathway</td>
		</tr>
		<tr height="42">
			<td height="42" style="height:42px;width:269px;">Bases and Post Holders Essentials Kit, Metric and Universal Components</td>
			<td style="width:88px;">Thorlabs</td>
			<td style="width:104px;">ESK01/M</td>
			<td style="width:220px;">Basis&#160;</td>
		</tr>
		<tr height="42">
			<td height="42" style="height:42px;width:269px;">Posts &#38; Accessories Essentials Kit, Metric and Universal Components</td>
			<td style="width:88px;">Thorlabs</td>
			<td style="width:104px;">ESK03/M</td>
			<td style="width:220px;"></td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:269px;">M6 Cap Screw and Hardware Kit</td>
			<td style="width:88px;">Thorlabs</td>
			<td style="width:104px;">HW-KIT2/M</td>
			<td style="width:220px;"></td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:269px;">Construction Rails</td>
			<td style="width:88px;">Thorlabs</td>
			<td style="width:104px;">XE25L700/M</td>
			<td style="width:220px;"></td>
		</tr>
		<tr height="42">
			<td height="42" style="height:42px;width:269px;">1&#34; Construction Cube</td>
			<td style="width:88px;">Thorlabs</td>
			<td style="width:104px;">RM1G</td>
			<td style="width:220px;">Used to mount construction rails</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:269px;">Electrical discharge machining</td>
			<td style="width:88px;">Sodick</td>
			<td style="width:104px;">AG60L</td>
			<td style="width:220px;">www.sodick.de</td>
		</tr>
		<tr height="84">
			<td height="84" style="height:84px;width:269px;">St37 block of steel (100 x 100 x 40) mm</td>
			<td style="width:88px;">BAM</td>
			<td style="width:104px;"></td>
			<td style="width:220px;">selfmade, hidden defect with remaining wall thicknesses of 0.25 mm, 0.5 mm, 0.70 mm 1.25 mm (shown in Fig. 5)</td>
		</tr>
		<tr height="84">
			<td height="84" style="height:84px;width:269px;">St37 block of steel (100 x 100 x 40) mm</td>
			<td style="width:88px;">BAM</td>
			<td style="width:104px;"></td>
			<td style="width:220px;">selfmade, hidden defect with remaining wall thicknesses of 1 mm, 1.5 mm, 1.75 mm, 2 mm (shown in Fig. 5)</td>
		</tr>
		<tr height="63">
			<td height="63" style="height:63px;width:269px;">Graphite spray</td>
			<td style="width:88px;">CRC Industries Europe NV</td>
			<td style="width:104px;">GRAPHIT 33</td>
			<td style="width:220px;">Ref. 20760, 200 ml aerosol (Kontakt-Chemie)</td>
		</tr>
		<tr height="42">
			<td height="42" style="height:42px;width:269px;">Protective tape</td>
			<td style="width:88px;">Tesa</td>
			<td style="width:104px;">tesakrepp 4348</td>
			<td style="width:220px;">used to protect the hidden defects while coating</td>
		</tr>
	</tbody>
</table>

subsurface defect localization by structured heating using laser projected photothermal thermography

Sunulan yöntem yüzeye dik olarak yönlendirilmiş yeraltı kusurlarını bulmak için kullanılır. Bunu başarmak için, kusur tarafından bozulan yıkıcı müdahale eden termal dalga alanları oluşturuyoruz. Bu etki ölçülür ve kusurun yerini belirlemek için kullanılır. Değiştirilmiş bir projektör kullanarak zararlı etkileşimli dalga alanlarını oluşturuyoruz. Projektörün orijinal ışık motoru fiberle bağlanmış yüksek güçlü diyot lazerle değiştirilir. Kirişi, projektörün mekansal ışık modülatörüne şekillendirilmiş ve hizalanmıştır ve en başta ışın profilini karakterize ederek ve daha sonra bunu mekanik ve sayısal olarak düzelterek optimum optik verimlilik ve homojen projeksiyon için optimize edilmiştir. Sıkı geometrik duruma (geometrik görüntü bozulmalarının düzeltilmesi dahil) ve numune yüzeyindeki zayıf sıcaklık osilasyonlarını tespit etme gereksinimine göre yüksek performanslı kızılötesi (IR) kamera ayarlanır. Veri toplama işlemi, bir kez eşzamanlı olarak gerçekleştirilebilirBireysel termal dalga alanı kaynakları, tarama aşaması ve IR kamera arasındaki ronizasyon, incelenen spesifik materyale göre ayarlanması gereken özel bir deneysel kurulum kullanılarak oluşturulmuştur. Veri sonrası işleme sırasında, numunenin altındaki bir kusur varlığı ile ilgili bilgi çıkarılır. Numune yüzeyinin sözde tükenme hattından gelen kazanılmış termal radyasyonun titreşen kısmından alınır. Kusurun kesin yeri, son adımda bu salınımların uzaysal-zamansal şeklinin analizinden çıkarılır. Yöntem referans içermez ve termal dalga alanı içerisindeki değişikliklere çok duyarlıdır. Şimdilik, yöntem çelik numuneler ile test edilmiştir, ancak özellikle sıcaklık duyarlı malzemeler için farklı malzemeler için de geçerlidir.

Protokolü takiben, 0.25 mm&#39;lik bir derinlikte yüzey altı bir kusurlu çelik numunenin 1. tarafı, temsili sonuçlar üretmek üzere seçildi. Arıza başlangıçta yaklaşık aydınlık alanın ortasına yerleştirildi. Daha sonra örnek 0.05 mm / s&#39;lik bir hızda doğrusal adım üzerinden -5 mm&#39;den 5 mm&#39;ye taşınmıştır. Bu parametreleri kullanarak Şekil 11a tarama verilerini tükenme çizgisinden çıkardıktan sonra gösterir. Bu aşamada, dene...

Watch this Scientific Journal Video about Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography at JoVE.com

Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography

Bu yöntem dikey yüzey altı kusurların bulunmasını amaçlamaktadır. Burada, bir lazeri bir alansal ışık modülatörüyle birleştirip, iki aşamalı modüle edilmiş çizgi ile deterministik olarak bir örnek yüzeyini ısıtmak için video girdisini tetikleyip çok çözünen termal görüntüler elde ediyoruz. Arıza konumu, termal dalga girişim minimum değerinin değerlendirilmesinden alınır.

Lazerle Projeksiyonlu Fototermal Termografi Kullanılarak Yapısal Isıtma Yöntemiyle Alt Yüzey Kusurlu Lokalizasyonu

The presented method is used to locate subsurface defects oriented perpendicularly to the surface. To achieve this, we create destructively interfering ...

subsurface-defect-localization-structured-heating-using-laser

Universidad de Cartagena UDEC

Research

JoVE Journal

Engineering

11.0K Görüntüleme.  Bundesanstalt für Materialforschung und -prüfung (BAM).  Bu yöntem dikey yüzey altı kusurların bulunmasını amaçlamaktadır. Burada, bir lazeri bir alansal ışık modülatörüyle birleştirip, iki aşamalı modüle edilmiş çizgi ile deterministik olarak bir örnek yüzeyini ısıtmak için video girdisini tetikleyip çok çözünen termal görüntüler elde ediyoruz. Arıza konumu, termal dalga girişim minimum değerinin değerlendirilmesinden alınır. 

Video: Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography

Investigation of Early Plasma Evolution Induced by Ultrashort Laser Pulses

Early plasma is generated owing to high intensity laser irradiation of target and the subsequent target material ionization. Its dynamics plays a significant role in laser-material interaction, especially in the air environment1-11.
Early plasma evolution has been captured through pump-probe shadowgraphy1-3 and interferometry1,4-7. However, the studied time frames and applied laser parameter ranges are limited. For example, direct examinations of plasma front locations and electron number densities within a delay time of 100 picosecond (ps) with respect to the laser pulse peak are still very few, especially for the ultrashort pulse of a duration around 100 femtosecond (fs) and a low power density around 1014 W/cm2. Early plasma generated under these conditions has only been captured recently with high temporal and spatial resolutions12. The detailed setup strategy and procedures of this high precision measurement will be illustrated in this paper. The rationale of the measurement is optical pump-probe shadowgraphy: one ultrashort laser pulse is split to a pump pulse and a probe pulse, while the delay time between them can be adjusted by changing their beam path lengths. The pump pulse ablates the target and generates the early plasma, and the probe pulse propagates through the plasma region and detects the non-uniformity of electron number density. In addition, animations are generated using the calculated results from the simulation model of Ref. 12 to illustrate the plasma formation and evolution with a very high resolution (0.04 ~ 1 ps).
Both the experimental method and the simulation method can be applied to a broad range of time frames and laser parameters. These methods can be used to examine the early plasma generated not only from metals, but also from semiconductors and insulators.

An experimental method to examine the early plasma evolution induced by ultrashort laser pulses is described. Using this method, high quality images of early plasma are obtained with high temporal and spatial resolutions. A novel integrated atomistic model is used to simulate and explain the mechanisms of early plasma.

Erken Plazma Evrim Araştırılması ultrashort Lazer Bakliyat Bağlı

Early plasma is generated owing to high intensity laser irradiation of target and the subsequent target material ionization. Its dynamics plays a ...

Mühendislik

Fabrication of Nano-engineered Transparent Conducting Oxides by Pulsed Laser Deposition

Nanosecond Pulsed Laser Deposition (PLD) in the presence of a background gas allows the deposition of metal oxides with tunable morphology, structure, density and stoichiometry by a proper control of the plasma plume expansion dynamics. Such versatility can be exploited to produce nanostructured films from compact and dense to nanoporous characterized by a hierarchical assembly of nano-sized clusters. In particular we describe the detailed methodology to fabricate two types of Al-doped ZnO (AZO) films as transparent electrodes in photovoltaic devices: 1) at low O2 pressure, compact films with electrical conductivity and optical transparency close to the state of the art transparent conducting oxides (TCO) can be deposited at room temperature, to be compatible with thermally sensitive materials such as polymers used in organic photovoltaics (OPVs); 2) highly light scattering hierarchical structures resembling a forest of nano-trees are produced at higher pressures. Such structures show high Haze factor (&gt;80%) and may be exploited to enhance the light trapping capability. The method here described for AZO films can be applied to other metal oxides relevant for technological applications such as TiO2, Al2O3, WO3 and Ag4O4.

We describe the experimental method to deposit nanostructured oxide thin films by nanosecond Pulsed Laser Deposition (PLD) in the presence of a background gas. By using this method Al-doped ZnO (AZO) films, from compact to hierarchically structured as nano-tree forests, can be deposited.

Fabrikasyon Pulsed Lazer Biriktirme tarafından Transparent letken Oksitler Nano-mühendislik

Nanosecond Pulsed  Laser Deposition (PLD) in the presence of a background gas allows the deposition  of metal oxides with tunable morphology, structure, ...

Selective Area Modification of Silicon Surface Wettability by Pulsed UV Laser Irradiation in Liquid Environment

The wettability of silicon (Si) is one of the important parameters in the technology of surface functionalization of this material and fabrication of biosensing devices. We report on a protocol of using KrF and ArF lasers irradiating Si (001) samples immersed in a liquid environment with low number of pulses and operating at moderately low pulse fluences to induce Si wettability modification. Wafers immersed for up to 4 hr in a 0.01% H2O2/H2O solution did not show measurable change in their initial contact angle (CA) ~75&#176;. However, the 500-pulse KrF and ArF lasers irradiation of such wafers in a microchamber filled with 0.01% H2O2/H2O solution at 250 and 65 mJ/cm2, respectively, has decreased the CA to near 15&#176;, indicating the formation of a superhydrophilic surface. The formation of OH-terminated Si (001), with no measurable change of the wafer&#8217;s surface morphology, has been confirmed by X-ray photoelectron spectroscopy and atomic force microscopy measurements. The selective area irradiated samples were then immersed in a biotin-conjugated fluorescein-stained nanospheres solution for 2 hr, resulting in a successful immobilization of the nanospheres in the non-irradiated area. This illustrates the potential of&#160;the method for selective area biofunctionalization and fabrication of advanced Si-based biosensing architectures. We also describe a similar protocol of irradiation of wafers immersed in methanol (CH3OH) using ArF laser operating at pulse fluence of 65 mJ/cm2 and in situ formation of a strongly hydrophobic surface of Si (001) with the CA of 103&#176;. The XPS results indicate ArF laser induced formation of Si&#8211;(OCH3)x compounds responsible for the observed hydrophobicity. However, no such compounds were found by XPS on the Si surface irradiated by KrF laser in methanol, demonstrating the inability of the KrF laser to photodissociate methanol and create -OCH3 radicals.

We report on a process of in situ alteration of HF treated Si (001) surface into a hydrophilic or hydrophobic state by irradiating samples in microfluidic chambers filled with&#160;H2O2/H2O solution (0.01%-0.5%) or methanol solutions using pulsed UV laser of a relative low pulse fluence.

Sıvı Ortamda Darbeli UV Lazer Radyasyonla Silikon Yüzey Islanabilirliği Seçici Alan Değişikliği

The wettability of silicon (Si) is one of the important parameters in the technology of surface functionalization of this material and fabrication of ...

Multifunctional Hybrid Fe2O3-Au Nanoparticles for Efficient Plasmonic Heating

One of the most widely used methods for manufacturing colloidal gold nanospherical particles involves the reduction of chloroauric acid (HAuCl4) to neutral gold Au(0) by reducing agents, such as sodium citrate or sodium borohydride. The extension of this method to decorate iron oxide or similar nanoparticles with gold nanoparticles to create multifunctional hybrid Fe2O3-Au nanoparticles is straightforward. This approach yields fairly good control over Au nanoparticle dimensions and loading onto Fe2O3. Additionally, the Au metal size, shape, and loading can easily be tuned by changing experimental parameters (e.g., reactant concentrations, reducing agents, surfactants, etc.). An advantage of this procedure is that the reaction can be done in air or water, and, in principle, is amenable to scaling up. The use of such optically tunable Fe2O3-Au nanoparticles for hyperthermia studies is an attractive option as it capitalizes on plasmonic heating of gold nanoparticles tuned to absorb light strongly in the VIS-NIR region. In addition to its plasmonic effects, nanoscale Au provides a unique surface for interesting chemistries and catalysis. The Fe2O3 material provides additional functionality due to its magnetic property. For example, an external magnetic field could be used to collect and recycle the hybrid Fe2O3-Au nanoparticles after a catalytic experiment, or alternatively, the magnetic Fe2O3 can be used for hyperthermia studies through magnetic heat induction. The photothermal experiment described in this report measures bulk temperature change and nanoparticle solution mass loss as functions of time using infrared thermocouples and a balance, respectively. The ease of sample preparation and the use of readily available equipment are distinct advantages of this technique. A caveat is that these photothermal measurements assess the bulk solution temperature and not the surface of the nanoparticle where the heat is transduced and the temperature is likely to be higher.

Multifunctional Hybrid Fe2O3-Au Nanoparticles for Efficient Plasmonic Heating

We describe the synthesis and properties of multifunctional Fe2O3-Au nanoparticles produced by a wet chemical approach and investigate their photothermal properties using laser irradiation. The composite Fe2O3-Au nanoparticles retain the properties of both materials, creating a multifunctional structure with excellent magnetic and plasmonic properties.

Çok fonksiyonlu Hibrid Fe<sub&gt; 2</sub&gt; O<sub&gt; 3</sub&gt; Verimli plasmonik Isıtma -Au Nanoparçacıklar

One of the most widely used methods for manufacturing colloidal gold nanospherical particles involves the reduction of chloroauric acid (HAuCl4) to ...

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

A micro-electro-mechanical-system (MEMS) is a widely used component in many industries, including energy, biotechnology, medical, communications, and automotive. However, effective inspection and characterization metrology systems are needed to ensure the functional reliability of MEMS. This study presents a system based on digital holography as a tool for MEMS metrology. Digital holography has gained increasing attention in the past 20 years. With the fast development and decreasing cost of sensor arrays, resolution of such systems has increased broadening potential applications. Thus, it has attracted attention from both research and industry sides as a potential reliable tool for industrial metrology. Indeed, by recording the interference pattern between an object beam (which contains sample height information) and a reference beam on a CCD camera, one can retrieve the quantitative phase information of an object. However, most of digital holographic systems are bulky and thus not easy to implement on industry production lines. The novelty of the system presented is that it is lens-less and thus very compact. In this study, it is shown that the Compact Digital Holographic Microscope (CDHM) can be used to evaluate several characteristics typically consider as criteria in MEMS inspections. The surface profiles of MEMS in both static and dynamic conditions are presented. Comparison with AFM is investigated to validate the accuracy of the CDHM.

We present a compact reflection digital holographic system (CDHM) for inspection and characterization of MEMS devices. A lens-less design using a diverging input wave providing natural geometrical magnification is demonstrated. Both static and dynamic studies are presented.

MEMS Muayene ve Karakterizasyonu için kompakt Lens az Dijital Holografik Mikroskop

A micro-electro-mechanical-system (MEMS) is a widely used component in many industries, including energy, biotechnology, medical, communications, and ...

Electroactive Polymer Nanoparticles Exhibiting Photothermal Properties

A method for the synthesis of electroactive polymers is demonstrated, starting with the synthesis of extended conjugation monomers using a three-step process that finishes with Negishi coupling. Negishi coupling is a cross-coupling process in which a chemical precursor is first lithiated, followed by transmetallation with ZnCl2. The resultant organozinc compound can be coupled to a dibrominated aromatic precursor to give the conjugated monomer. Polymer films can be prepared via electropolymerization of the monomer and characterized using cyclic voltammetry and ultraviolet-visible-near infrared (UV-Vis-NIR) spectroscopy. Nanoparticles (NPs) are prepared via emulsion polymerization of the monomer using a two-surfactant system to yield an aqueous dispersion of the polymer NPs. The NPs are characterized using dynamic light scattering, electron microscopy, and UV-Vis-NIR-spectroscopy. Cytocompatibility of NPs is investigated using the cell viability assay. Finally, the NP suspensions are irradiated with a NIR laser to determine their effectiveness as potential materials for photothermal therapy (PTT).

A protocol is presented for the synthesis and preparation of nanoparticles consisting of electroactive polymers.

Elektroaktif Polimer nanopartiküller Sergileme Fototermal Özellikleri

A method for the synthesis of electroactive polymers is demonstrated, starting with the synthesis of extended conjugation monomers using a three-step ...

Automation of Mode Locking in a Nonlinear Polarization Rotation Fiber Laser through Output Polarization Measurements

When a laser is mode-locked, it emits a train of ultra-short pulses at a repetition rate determined by the laser cavity length. This article outlines a new and inexpensive procedure to force mode locking in a pre-adjusted nonlinear polarization rotation fiber laser. This procedure is based on the detection of a sudden change in the output polarization state when mode locking occurs. This change is used to command the alignment of the intra-cavity polarization controller in order to find mode-locking conditions. More specifically, the value of the first Stokes parameter varies when the angle of the polarization controller is swept and, moreover, it undergoes an abrupt variation when the laser enters the mode-locked state. Monitoring this abrupt variation provides a practical easy-to-detect signal that can be used to command the alignment of the polarization controller and drive the laser towards mode locking. This monitoring is achieved by feeding a small portion of the signal to a polarization analyzer measuring the first Stokes parameter. A sudden change in the read out of this parameter from the analyzer will occur when the laser enters the mode-locked state. At this moment, the required angle of the polarization controller is kept fixed. The alignment is completed. This procedure provides an alternate way to existing automating procedures that use equipment such as an optical spectrum analyzer, an RF spectrum analyzer, a photodiode connected to an electronic pulse-counter or a nonlinear detecting scheme based on two-photon absorption or second harmonic generation. It is suitable for lasers mode locked by nonlinear polarization rotation. It is relatively easy to implement, it requires inexpensive means, especially at a wavelength of 1550 nm, and it lowers the production and operation costs incurred in comparison to the above-mentioned techniques.

A protocol to detect and automate mode locking in a pre-adjusted nonlinear polarization rotation fiber laser is presented. The detection of a sudden change in the output polarization state when mode locking occurs is used to command the alignment of an intra-cavity polarization controller in order to find mode-locking conditions.

Çıktı Polarizasyon Ölçümler aracılığıyla Doğrusal Olmayan Polarizasyon Rotasyon Fiber Lazer Mod Kilitleme Otomasyonu

When a laser is mode-locked, it emits a train of ultra-short pulses at a repetition rate determined by the laser cavity length. This article outlines a ...

Measuring Spray Droplet Size from Agricultural Nozzles Using Laser Diffraction

When making an application of any crop protection material such as an herbicide or pesticide, the applicator uses a variety of skills and information to make an application so that the material reaches the target site (i.e., plant). Information critical in this process is the droplet size that a particular spray nozzle, spray pressure, and spray solution combination generates, as droplet size greatly influences product efficacy and how the spray moves through the environment. Researchers and product manufacturers commonly use laser diffraction equipment to measure the spray droplet size in laboratory wind tunnels. The work presented here describes methods used in making spray droplet size measurements with laser diffraction equipment for both ground and aerial application scenarios that can be used to ensure inter- and intra-laboratory precision while minimizing sampling bias associated with laser diffraction systems. Maintaining critical measurement distances and concurrent airflow throughout the testing process is key to this precision. Real time data quality analysis is also critical to preventing excess variation in the data or extraneous inclusion of erroneous data. Some limitations of this method include atypical spray nozzles, spray solutions or application conditions that result in spray streams that do not fully atomize within the measurement distances discussed. Successful adaption of this method can provide a highly efficient method for evaluation of the performance of agrochemical spray application nozzles under a variety of operational settings. Also discussed are potential experimental design considerations that can be included to enhance functionality of the data collected.

We present protocols to be used in the measurement of spray droplet size from agricultural nozzles used in both aerial and ground based agrochemical applications. These methods presented were developed to provide consistent and repeatable droplet size data both inter- and intra-laboratory, when using laser diffraction systems.

Lazer difraksiyonu kullanılarak tarım memelerden Ölçüm Sprey damlacık boyutu

When making an application of any crop protection material such as an herbicide or pesticide, the applicator uses a variety of skills and information to ...

Quantitative Analysis of Vacuum Induction Melting by Laser-induced Breakdown Spectroscopy

Vacuum induction melting is a popular method for refining high purity metal and alloys. Traditionally, standard process control in metallurgy involves several steps, include drawing samples, cooling, cutting, transport to the laboratory, and analysis. The whole analysis process requires more than 30 minutes, which hinders on-line process control. Laser-induced breakdown spectroscopy is an excellent on-line analysis method that can satisfy the requirements of vacuum induction melting because it is fast and noncontact and does not require sample preparation. The experimental facility uses a lamp-pumped Q-switched laser to ablate melted liquid steel with an output energy of 80 mJ, a frequency of 5 Hz, a FWHM pulse width of 20 ns, and a working wavelength of 1,064 nm. A multi-channel linear charge coupled device (CCD) spectrometer is used to measure the emission spectrum in real time, with a spectral range from 190 to 600 nm and a resolution of 0.06 nm at a wavelength of 200 nm. The protocol includes several steps: standard alloy sample preparation and an ingredient test, smelting of standard samples and determination of the laser breakdown spectrum, and construction of the elements concentration quantitative analysis curve of each element. To realize the concentration analysis of unknown samples, the spectrum of a sample also needs to be measured and disposed with the same process. The composition of all main elements in the melted alloy can be quantitatively analyzed with an internal standard method. The calibration curve shows that the limit of detection of most metal elements ranges from 20-250 ppm. The concentration of elements, such as Ti, Mo, Nb, V, and Cu, can be lower than 100 ppm, and the concentrations of Cr, Al, Co, Fe, Mn, C, and Si range from 100-200 ppm. The R2 of some calibration curves can exceed 0.94.

During vacuum induction melting, laser-induced breakdown spectroscopy is used to perform real-time quantitative analysis of the main-ingredient elements of a molten alloy.

Lazer kaynaklı arıza spektroskopisi ile vakum Indüksiyon erime niceliksel Analizi

Vacuum induction melting is a popular method for refining high purity metal and alloys. Traditionally, standard process control in metallurgy involves ...

Pore-scale Imaging and Characterization of Hydrocarbon Reservoir Rock Wettability at Subsurface Conditions Using X-ray Microtomography

In situ wettability measurements in hydrocarbon reservoir rocks have only been possible recently. The purpose of this work is to present a protocol to characterize the complex wetting conditions of hydrocarbon reservoir rock using pore-scale three-dimensional X-ray imaging at subsurface conditions. In this work, heterogeneous carbonate reservoir rocks, extracted from a very large producing oil field, have been used to demonstrate the protocol. The rocks are saturated with brine and oil and aged over three weeks at subsurface conditions to replicate the wettability conditions that typically exist in hydrocarbon reservoirs (known as mixed-wettability). After the brine injection, high-resolution three-dimensional images (2 &#181;m/voxel) are acquired and then processed and segmented. To calculate the distribution of the contact angle, which defines the wettability, the following steps are performed. First, fluid-fluid and fluid-rock surfaces are meshed. The surfaces are smoothed to remove voxel artefacts, and in situ contact angles are measured at the three-phase contact line throughout the whole image. The main advantage of this method is its ability to characterize in situ wettability accounting for pore-scale rock properties, such as rock surface roughness, rock chemical composition, and pore size. The in situ wettability is determined rapidly at hundreds of thousands of points. 
The method is limited by the segmentation accuracy and X-ray image resolution. This protocol could be used to characterize the wettability of other complex rocks saturated with different fluids and at different conditions for a variety of applications. For example, it could help in determining the optimal wettability that could yield an extra oil recovery (i.e., designing brine salinity accordingly to obtain higher oil recovery) and to find the most efficient wetting conditions to trap more CO2 in subsurface formations.

This protocol is presented to characterize the complex wetting conditions of an opaque porous medium (hydrocarbon reservoir rock) using three-dimensional images obtained by X-ray microtomography at subsurface conditions.

Gözenek ölçekli görüntüleme ve hidrokarbon rezervuar Rock Wettability x-ışını Microtomography kullanarak yeraltı koşulları, karakterizasyonu

In situ wettability measurements in hydrocarbon reservoir rocks have only been possible recently. The purpose of this work is to present a protocol to ...