Theoretical Calculation and Experimental Verification for Dislocation Reduction in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon
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06:57 min
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July 17th, 2020
DOI :
July 17th, 2020
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Rozdziały w tym wideo
0:04
Introduction
0:34
Experimental Verification Procedure
4:29
Results: Reduction of Threading Dislocation Density in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon
6:12
Conclusion
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